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Best Poster Awards
"Precise Measurement of Specimen Height by 3 Dimensional Fourier Filtering Method"
Masayuki Inamori, Yoshihide Kimura and Yoshizo Takai
The 70th Annual Meeting of the Japanese Society of Microscopy (Makuhari, Chiba, Japan, May 11-13, 2014)
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Best Poster Awards
"Structure Analysis of Molybdenum Oxide Encapsulated inside Carbn Nanotubes by Transmission Electron Diffraction"
Ryusuke Sagawa
The 68th Annual Meeting of the Japanese Society of Microscopy (Tsukuba, Japan, May 14-16, 2012)
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Best Poster Award
"Study on Molybdenum Oxide Encapsulated inside Carbn Nanotubes Using Transission Electron Microscopy"
Ryusuke Sagawa
4th International Symposium on Atomically Controlled Fabrication Technology (Osaka, Japan, October 31-November 2, 2011)
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Best Poster Award
"Study on Molybdenum Oxide Encapsulated inside Carbn Nanotubes Using Transission Electron Microscopy"
Ryusuke Sagawa
3rd International Symposium on Atomically Controlled Fabrication Technology (Osaka, Japan, November 24-26, 2010)
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Sakaki Award for Young Scientist of The 141st Committee on Microbeam Analysis of Japan Society for the Promotion of Science (JSPS)
Study on Interactions between Charged Particles (Electrons and Ions) with Solid Surface
Takaharu Nagatomi
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Student Award
"A Process for Exit Wave Reconstruction using Through-Focus Series of Images Taken under Critical Low Electron Dose Conditions"
Tsunenori Nomaguchi
6th International Symposium on Atomic Level Characterizations for New Materials and Devices '05 (ALC'05) (Kanazawa, Japan, October 28-November 2, 2007).
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Young Scientist Award for the Presentation of an Excellent Paper
30a-SH-5 "Restoration of Phase and Amplitute Component Using Active Hollow Cone Illumination in Transmission Electron Microscopy"
Hiromasa YOSHIMORI
Spring Meeting of the Japanese Society of Applied Physics, 2007
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EMAS President's Award
"Atomic Level Characterization Based on Focus Modulation Electron Microscopy"
Y.Takai, M.Taya, H.Chikada and Y.Kimura
9th European Workshop of the European Microbeam Analysis Society (Florence, Italy, May, 2005).
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Student Award
"Dependence of Depth Resolution on Primary Energy of Ions in Sputter Depth Profiling"
Takuya Bungo
5th International Symposium on Atomic Level Characterizations for New Materials and Devices '05 (ALC'05) (Hawaii, USA, Dec. 4-9, 2005).
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Young Scientist Award for the Presentation of an Excellent Paper
29p-YD-7 "Dependence of Depth Resolution on Ion Incident Energy in AES Sputter depth profiling"
Takuya BUNGO
Spring Meeting of the Japanese Society of Applied Physics, 2004
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Student Award
"Development of Coincidence Transmission Electron Microscope- Application of Waveform Measurement System"
Ken-ichi Nishinaka
4th International Symposium on Atomic Level Characterization for New Material and Deveices '03 (ALC '03) (Kauai, Hawaii, USA, Oct. 5-10, 2003)
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MSA Poster Award, First Place, Advances in Instrumentation and Techniques
"Dynamic Observation of an Atom-Sized Gold Wire by Real-Time Defocus Image Modulation Processing Electron Microscope"
Y. Takai, T. Kawasaki and Y. Kimura
Microscopy and Microanalysis 2002 (M&M 2002) (Quebec, Canada, Aug. 5-8, 2002)
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Student Award
"Atomic Level Characterization of Sc(100) Emitter at High Temperatures I"
Shin-ich Iida
3rd International Symposium on Atomic Level Characterization for New Material and Deveices '01 (ALC '01) (Nara, Japan, Nov. 11-Nov. 14, 2001)
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Student Award
"Phase Reconstruction with Aberration Correction by Three-Dimensional Fourier Filtering Method"
Tadahiro Kawasaki
3rd International Symposium on Atomic Level Characterization for New Material and Deveices '01 (ALC '01) (Nara, Japan, Nov. 11-14, 2001)
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Young Scientist Award for the Presentation of an Excellent Paper
28a-ZF-9 "Aberration Correction using Three-Dimensional Image Intensity Distribution"
Tadahiro KAWASAKI
Spring Meeting of the Japanese Society of Applied Physics, 2001
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45th SETO Prize (2000)
"Development of Real-time Defocus Image Modulation Processing Electron Microscope"
Yoshizo TAKAI and Mikio ICHIHASHI
Prize of Japanese Society of Electron Microscopy
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Student Award
"A Novel CCD Video Camera with Operation-Function Incorporated"
Kentaro Nishikata
The Second Meeting of the International Union of Microbeam Analysis Societies (IUMAS 2000) (Kailua-Kona, Hawaii, July 9-14, 2000)
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Young Scientist Award for the Presentation of an Excellent Paper
4a-W-4 "Real-time observation of spherical aberration-free phase image by real-time operational CCD camera I"
Kentarou NISHIKATA
Autumn Meeting of the Japanese Society of Applied Physics, 2000
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14th Award for Excellent Paper of Japanese Society of Electron Microscopy (1999)
"Development of coincidence transmission electron microscope (II) Observation of coincidence electron microscopic image"
Motohide YASUNO, Yoshihide KIMURA and Ryuichi SHIMIZU
J. Elect. Microsc. 46, No. 1, 79-83 (1997).
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Young Scientist Award for the Presentation of an Excellent Paper
31a-YE-5 "REELS-XPS Analysis of Oxygen-Adsorbed a-Si [I] -Effective Energy Loss Function-"
Takaharu Nagatomi
Spring Meeting of the Japanese Society of Applied Physics, 1999
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Young Scientist Award for the Presentation of an Excellent Paper
29a-SZC-5 "High Resolution Spherical-Aberration-Free Imaging using Hollow Cone Illuminatilon and Defocus Image Modulation Processing"
Hidetoshi UTSURO
Spring Meeting of the Japanese Society of Applied Physics, 1997
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9th Award for Excellent Paper of Japanese Society of Electron Microscopy (1994)
"Correction of Spherical Aberration in HREM Image Using Defocus-Modulation Image Processing"
M. Taniguchi, Y. Takai, T. Ikuta and R. Shimizu
J. Elect. Microsc. 41, No. 1, 21-29 (1992).
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3rd Award for Excellent Paper of Japanese Society of Applied Physics (1981)
Hatsujiro HASHIMOTO, Yoshizo TAKAI, Yassuhiro YOKOTA and Eisaku HUKADA