Review

2012”N

  • "Standardization of Surface Electron Spectroscopy and Depth Profiling "
    M. Suzuki, T. Nagatomi, and K. Takahashi
    BUNSEKI No. 7, 371-377 (2012) (in Japanese).
  • "High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Holder based on Geometric Characteristics of Auger Electron Spectroscopy Apparatus Equipped with Concentric Hemispherical Analyzer"
    T. Ogiwara, T. Nagatomi, K. J. Kim and S. Tanuma
    J. Surf. Anal. 18, No. 3, 174-182 (2012) (in Japanese).

2011

  • "PSA10: 5th International Symposium on Practical Surface Analysis"
    K. J. Kim and T. Nagatomi
    J. Surf. Anal. 17, No. 3, 350-355 (2011).
  • "Photoemission Electron Spectroscopy V: Novel topics"
    J. D. Lee, T. Nagatomi, G. Mizutani, and K. Endo
    J. Surf. Anal. 18, No. 1, 36-57 (2011).
  • "Report of WG Activity at 36th Meeting of SASJ"
    T. Nagatomi
    J. Surf. Anal. 18, No. 1, 58-63 (2011).
  • "Questions and Answers Discussed at JIS-ISO Seminar 2011"
    T. Nagatomi
    J. Surf. Anal. 18, No. 2, 121-132 (2011) (in Japanese).
  • "Report of WG Activity at 37th Meeting of SASJ"
    T. Nagatomi
    J. Surf. Anal. 18, No. 2, 133-133 (2011).

2010

  • "Surface Excitations in Surface Electron Spectroscopies Studied by Reflection Electron Energy Loss Spectroscopy and Elastic Peak Electron Spectroscopy"
    T. Nagatomi and S. Tanuma
    Analytical Sci. 26, No.2, 165-176 (2010).
  • "Photoemission Electron Spectroscopy III: Satellites by Extended Excitations"
    J. D. Lee, T. Nagatomi, G. Mizutani, and K. Endo
    J. Surf. Anal. 16, No.3, 196-213 (2010).
  • "Photoemission Electron Spectroscopy IV: Angle-resolved photoemission spectroscopy"
    J. D. Lee, T. Nagatomi, G. Mizutani, and K. Endo
    J. Surf. Anal. 17, No.2, 64-86 (2010).

2009

  • "Photoemission Electron Spectroscopy I: Histry and Overview"
    J. D. Lee, T. Nagatomi, G. Mizutani, and K. Endo
    J. Surf. Anal. 16, No.1, 42-63 (2009).
  • "Conference Report on iSAS-09"
    H. Yoshikawa, T. Nagatomi, and K. Takahashi
    J. Surf. Anal. 16, No.1, 64-69 (2009). (in Japanese)
  • "Photoemission Electron Spectroscopy II: Satellites by Local Excitations"
    J. D. Lee, T. Nagatomi, G. Mizutani, and K. Endo
    J. Surf. Anal. 16, No.2, 127-152 (2009).

2008

  • "Questionnaries Survey for Depth Profiling"
    T. Nagatomi, K. Takahashi, and H. Yoshikawa
    J. Surf. Anal. 15, No.1, 27-39 (2008).
  • "Proposal for International SASJ Mini Workshop"
    H. Yoshikawa, T. Nagatomi, and K. Takahashi
    J. Surf. Anal. 15, No.1, 89-90 (2008).

2005

  • "Phase Reconstruction and Resolution Improvement by Real-Time Defocus Image Modulation Processing Electron Microscope"
    Y. TAKAI, Y. KIMURA, T. IKUTA, and T. KAWASAKI
    J. Cryst. Soc. Jpn. 47, No.2, 32-37 (2005).
  • "Electron Transport in Solids for Surface Chemical Analysis (News & Trends)"
    T. Nagatomi
    J. Surf. Sci. Soc. Jpn. 26, No.2, 49-49 (2005) (in Japanese).
  • "Software and Standardization in Surface Chemical Analysis"
    T. Nagatomi
    J. Surf. Anal. 12, No.3, 316-326 (2005) (in Japanese).
  • "Questionnaire Surfey for EPMA and EDS Analyses at Actual Laboratories"
    S. Hashimoto, T. Nagatomi, and T. Kimura
    J. Surf. Anal. 12, No.4, 405-412 (2005).
  • "Elastic Scattering Effects of Electrons in Surface Analysis"
    H. Yoshikawa, T. Nagatomi, and M. Kimura
    J. Surf. Sci. Soc. Jpn. 27, No.11, 628-635 (2005) (in Japanese).

2004

  • "Study on Surface Excitations by Background Analysis"
    T. Nagatomi
    J. Surf. Anal. 11, No.2, 77-90 (2004) (in Japanese).
  • "Development of Noble Techniuques for Studing Electron Emitting Materials in Flat Panel Displays"
    T. Nagatomi, T. Tsujita, Y. Mizuhara, S. Iida and Y. Takai
    Monthly DISPLAY No.10, 113-119 (2004) (in Japanese).

2002

  • "Aberration-Free Phase Transmission Electron Microscope"
    Y. Takai
    OYOBUTSURI 71, No.4, 408-414 (2002) (in Japanese).
  • "Development of Real-time Image Processing CCD video camera for High Resolution Electron Microscope"
    K. Nishikata, Y. Kimura, Y. Takai, R. Shimizu, H. Yumen
    Chemical Engineering 47, No.4, 44-52 (2002) (in Japanese).
  • "Spherical Aberration Corrected Phase Image of Gold Fine Particle by Three-Dimensional Fourier Filtering Method"
    Y. Takai and T. Kawasaki
    Materia 41, No.12, 886-887 (2002) (in Japanese).

1999

  • "Reconstruction of ultra-high vacuum reflection electron microscope"
    S. Iida, S. Awata, T. Asahata, T. Nagatomi, Y. Kimura, Y. Takai and R. Shimizu
    Technol. Repts. Osaka Univ. 49 (1999) 99-104.
  • "Defocus-Image Modulation Processing as Applied to Observation of Unstained Biological Specimen"
    M.Sato, T.Ando, Y.Takai and R.Shimizu
    Technol. Repts. Osaka Univ. 49 (1999) 105-110.

1997

  • "Cross-sectional TEM Sample reparation by FIB"
    Y.Takai, M.Tarutani, R.Shimizu, H.Saka
    J. Electron Microsc. (in japanese) 32,No.1(1997)33-38.

1996

  • "Transmission Electron Microscope: (1)Outline,Japan New Diamond Forum,(in Japanese)"
    M.Tarutani, Y.Takai, R.Shimizu
    12,No.3(1996,July)36-39.
  • "Transmission Electron Microscope: (2)Sample preparation,Japan New Diamond Forum, (in japanese)"
    M.Tarutani, Y.Takai, R.Shimizu
    12,No.4(1996)36-40.
  • "Infrared Light Heating System for Precise Temperature Control of Specimen in Reflection Electron Microscope"
    T.Akita, T. Nagata, Y.Kimura and R.Shimizu
    Technol. Repts. of Osaka Univ.,46No.2247(1996)137-141

1995

  • "Cross Sectional TEM Observation of Homoepitaxial Diamond"
    M.Tarutani, Y.Takai, R.Shimizu, Y.Ando, M.Kamo
    Japan New Diamond Forum,(in japanese) 11,No.1(1995,Jan)21-25 .
  • "On the preparation of TEM specimens using focused ion beam"
    M.Tarutani, Y.Kaihara, Y.Takai, R.Shimizu
    J. Surface Sci. Soc. Japan., (in japanese) 16,No.12(1995)755-760 .
  • "Practical Improvement of MS-Xα molecular orbital calculation as applied to dissociation process of CO molcule"
    Y.Irokawa, M.Honjo, Y.Takai and R.Shimizu
    Technol. Repts. Osaka Univ., 45(1995)7-16.
  • "Coma-free alignment of TEM using through-tilt images"
    T.Nagata, T.Ando, Y.Takai and R.Shimizu
    Technol. Repts. of the Osaka Univ., 45(1995)107-115.
  • "Observation of profile images of surface atomic steps with spherical aberration correction"
    Y.Takai
    J. Electron Microsc.(in japanese),30,No.2(1995)197-200.

1994

  • "Development of Coincidence Transmission Electron Microscope (II) Time Correlation between Characteristic X-Rays and Transmitted Electrons"
    M.Yasuno, Y.Kimura and R.Shimizu
    Technol. Reps. Osaka Univ. Vol.44, no.2188 (1994) 229-234.
  • "New Parallel Observation System for LEED-AES with CCD Detector"
    N.Ebisu, Y.Kimura and R.Shimizu
    Technol. Reps. Osaka Univ. Vol.44, no.2187 (1994) 223-227.
  • "Developement of simulation code for electron microscope images by Howie-Whelan dynamical electron diffraction theory"
    Z.D.Zheng, Y.Takai and R.Shimizu
    Technological reports of Osaka University, 44, No.2165(Ap, 1994)21-27.
  • "Recent Developments in High Resolution Electron Microscopy,-Challenge to information limit of electron microscope -"
    Y.Takai
    J. Crystallographic Soc. Japan, (in japanese) 36,No.6 (1994)375-381 .

1993

  • "Construction of New LEED Optics for Intelligent LEED System"
    Y.Kimura, K.Nakashita, N.Ebisu, H.Yoshikawa, R.Shimizu and T.Noguchi
    Technol. Repts. Osaka Univ. Vol.43, no.2126 (1993) 17-24.
  • High energy-resolution Auger electron spectroscopy with retarding field cylindrical mirror analyzer"
    M.Souma, Li.Chung-Fei A.Kurokawa, Y.Kimura, R.Shimizu and Y.Sakai
    Technol. Repts. Osaka Univ.Vol.43,No.2142-2162 (1993) 181-186.
  • "Development of a Focused Ion Beam Apparatus for Preparing Cross-Sectional Transmission Electron Microscope Specimens"
    M.Tarutani, Y.Takai, R.Shimizu, K.Uda and H.Takahashi
    Technological Report of Osaka University , 43(1993)167-173.

1992

  • "The magnetic domains in Co Fine particles observed by Lorentz electron microscopy and electron holography"
    M.Tarutani, K.Harada, Y.Takai and R.Shimizu
    Technol. Repts. Osaka Univ., 31(1992)67-75.
  • "Development of coincidence transmission electron microscope. (I) Image construction by position sensitive multi-anode photomultiplier"
    Y.Kimura, A.Sugimoto, M.Yasuno and R.Shimizu
    Technol. Repts. Osaka Univ. Vol.42,No.2101-2123 (1992) 247-52.

1989

  • "Tripod type piezo-holder for scanning tunneling microscope"
    Y.Kimura, S.Tamoto and R.Shimizu
    Technol. Repts. Osaka Univ., Vol.39, No.1959-1985, (1989) 137-140.

1988

  • "Construction of a scanning tunneling microscope"
    Y.Kimura and R.Shimizu
    Technol. Repts. Osaka Univ., Vol.38,No.1930-1946, (1988) 223-228.

1983

  • "Observation of lattice imperfections and their motion in atomic scale"(in japanease)
    H.Hashimoto and Y.Takai
    Jap. J. of Metal, Vol.22, No.7(1983),p595-609.
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