Mr Thesises

2017

• (No graduates)

2016

• Structural Analysis of Magnetic Skirmions using Multiple Lorentz Transmission Electron Microscope Images
  Shigaku Nakane
• Development of Phase Electron Microscope System
  Yuta Hirabayashi

2015

• Specimen Height Measurement at an Atomic Scale by Three Dimensional Fourier Filtering Method
  Masayuki Inamori
• Development of High Speed Electron Blunking System for Dynamic Observation at an Atomic Scale
  Yukari Watanabe

2014

• Development of Modulation Transmission Electron Microscope System for High Resolution In-situ Observation
  Takahiro Tamura

2012

• Developement of an Auto Focussing System for TEM using Diffractgram Pattern Fitting
  Ryouhei Matsunaga

2012

• Stacknig structure analysis and quantitative evaluation of radiation damage in Halloysite by transmission electron microscopy with a minimal dose system
  Kiyofumi Mori

2011

• Computer simulation on visualization of hydrogen atom columns by annular bright-field scanning transmission electron microscopy
  Nobukazu Iseki

2010

• Studies on Structural Determination of Molybdenum Oxides Encapsulated inside CNTs and Thier Encapsulation Process
  Wataru Togashi
• High Resolution Wave Field Reconstruction using Three-Dimensional Fourier Filtering Method Applied to Tilted Illumination
  Fumiya Nakatani
• Changes in Ion-Induced Secondary Electron Yield of MgO Film Induced by Adsorption of H₂O and CO₂
  Yuko Murasawa

2009

• Development of Low Dose Imaging System for TEM with High Pixel Count Direct Electron Detection Type CCD
  Hiroshi Kizawa
• Study on Aberration-Free Transmission Electron Microscopy using Dynamic Hollow-Cone Illumination
  Kohei Kitade
• Study on Molybdenum Oxide Encapsulated inside Carbon Nanotubes using Transmission Electron Microscopy
  Ryusuke Sagawa

2008

• "Monte Carlo Simulation of Electron-Excited X-ray Emission with Coster-Kronigh Transition"
  Shin-ichi Sato
• "Transmission Electron Microscope Observation and Electron Radiation Curing Phenomena of Ionic Liquids"
  Hirofumi Fujii
• "In-Situ TEM Observation of Graphite Formation using Cobarlt Oxide Nanocrystals"
  Takanori Yahiro
• "Measurement of Ion-Induced Secondary Electron Yield of MgO Thin Films by Pulsed-Ion Irradiation"
  Ikuma Yamauchi

2007

• "Measurement of Surface Potential of MgO Thin Film by Ion Scattering Spectroscopy"
  Takeshi Kuwayama
• "Observation of Transmission Electron Microscope Image using Direct Electron Detection Type Charge Coupled Device"
  Yuji Kojima
• "Electron-Induced Damage of SiO2 Surface in Oxygen Atmosphere"
  Hiraku Nakamura
• "Averration-Free Transmission Electron Microscopy using Dynamic Hollow-Cone Illumination"
  Hiromasa Yoshimori

2006

• "Dependence of Ion-Induced Secondary Electron Yield of MgO Thin Film on Film Thickness"
  Hajime Inazumi
• "Extended Functions of Three-Dimentional Fourier Filtering Method in Transmission Electron Microscopy and Their Applications"
  Toshiyuki Tsuji
• "Development of A Low Vibration Cold Specimen Holder and A Study on The Reduction of Electron Irradiation Damage"
  Toshihiro Yanai

2005

• "Atomic Level in-situ Observation of Graphite Formation using Oside Iron Particle"
  Thoshiki Kida
• "Phase Transition on Sc-O/W(100) Surface at High Temperature induced by the Difussion and Segragation of Sc-O Complexes"
  Yousuke Nakanishi
• "Study on Single Electron Detection with Charge Coupled Device for Transmission Electron Microscopy"
  Souko Fukahori

2004

• "Observation of Single Atom Using Aberration-Free Transmission Electron Microscopy"
  Hidekazu Chikada
• "Development of High-Resolution Transmission Electron Microscope System for Observation of Biological Sample"
  Tsunenori Nomaguchi
• "Dependence of Depth Resolution on Primary Energy of Ions in Sputter Depth Profiling"
  Takuya Bungo

2003

• "Study on Si/Si Thermal Oxide Interface Structure Using A SUper Resolution Phase Electron Microscopy"
  Masaki Taya
• "Nanoscale Structure Analysis of High-k HfSiO Film by Transmission Electron Microscopy"
  Naoto Tokita
• "Study of Electron Irradiation Damage in Electron Microscope"
  Misa Hayashida
• "Derivation of Empirical Formula for L-Shell Ionization Cross Section by Monte Carlo Simulation"
  Takaaki Hibi
• "Aberration-Free Phase Image of DNA Observed by Three-Dimensional Fourier Filtering Method"
  Shuhie Matsushita

2002

• "Removal of Focused Ion Beam Induced Damaged Layer by Low Energy Ion Irradiation"
  Junpeo Kato
• "Spherical Aberration-Free Phase Observation of Si/SiO₂ Interface"
  Hiroyuki Kutsubo
• "Study on Luminescence Properties of Porous Silicon Using Cathodoluminescence Scanning Electron Microscope"
  Tatsuya Kojima
• "Development of Real-Time Elemental Mapping System Using Floating Type Imaging Energy Filter"
  Yusuke Shimazaki
• "High Resolution Observsation of DNA by A Super Resolution Phase Electron Microscope"
  Koji Takenouchi
• "Development of Waveform measurement System for Coincidence Detection"
  Kenichi Nishinaka

2001

• "Study on Surface Fabricated by Low Energy Ion Beam using Transmission Electron Microscope"
  Keigo Iwamoto
• "Study on Domain Structure of CoSi₂ Thin Film using Transmission Electron Microscope"
  Takumi Ohtomo
• "Monte Carlo Simulation of X-Ray Generation by Electron Impact"
  Tomokazu Shimada
• "Characterisation of Sc-O/W(100) Surface as A Schottky Emitter at High Temperatures"
  Takuji Tsujita
• "in situ Observation of Si(100) Surface at High Temperatures by Transmission and Reflection Electron Microscope
  Yukako Higashi
• "Development of Defocus Image Moduration Processing Electron Microscopy System by Using Slow Scan CCD Camera"
  Ko Yamura

2000

• "Development of novel TEM system for observation of biological specimen using enviromental cell"
  Shinpei Hori
• "Study on Secondary Electron Emission from Semicondoctor and Insulator Surface under Electron Beam Irradiation"
  Yuzuru Mizuhara
• "Monte Carlo Simulation of Electron Trajectory under Low Vacuum Condition"
  Takeshi Yoshida