Undergraduate Thesises

2017

• Study on Automatic Adjustment of Illumination Angle of Electron Beam in Transmission Electron Microscopy
  Reiya Kaji

2016

• Precise Measurement of Specimen Hight using Phase Contrast Transfer Property
  Chinatsu Sakuraba
• Wavefield Reconstruction of Sub Nanometer Sized Clusters suported on a Single Layer Graphen
  Sou Nagashima

2015

• Development of an Atomic Scale Visualization Technique of Specimen Structural Changes using Real Time Wavefield Reconstructed Images
  Atsumu Toyoshima

2014

• Study on Electron Radiation Damage of Cu-Phthalocyanine Thin Crystalline Film
  Yushi Toyokura
• Phase Transmission Electron Microscopy using Ptychography Method
  Yuta Hirabayashi

2013

• Precise Measurement of Specimen Height by 3 Dimensional Fourier Filtering Method
  Masayuki Inamori
• Basic Study on Aberration-free Imaging in Transmission Electron Microscopy
  Yukari Watanabe

2012

• Acquisition of Three Dimensional Structure Information by 3D Fourier Filtering Method
  Masahide Suesada
• High Resolution In-situ TEM Observation of Graphene Growth Catalyzed by Cobalt Nanoparticles
  Takahiro Tamura

2011

• Correlation between Interface Position and Non-symmetry of sputter depth profile
  Yukinori Nakane
• Study on Quantum Efficiency of CCD Imaging Device for Transmission Electron Microscopy
  Shougo Fujima

2010

• Change in Ion-Indueced Secondary Electron Yield of MgO by Oxygen Adsorption
  Hirohito Koide
• Observation of Co Nano-Clusters on Graphene by Wave Field Reconstruction
  Hiroyuki Saito
• High-Resolution TEM Observation of Halloysite using Minimum-Dose System
  Kiyofumi Mori

2009

• Variation in Cathodeluminescence and Ion-Induced Secondary Electron Yield of MgO Film by Specimen Heating
  Zjargal Jargalsaikhan
• Aberration-Free TEM Observation of Cobarlt Nano Particles during Graphite Formation
  Takashi Sakurada

2008

• "Development of Measurement System of Electron Emission Properties of Sc-O/W(100) Emitter"
  Kiyomasa Nagata

2007

• "Dependence of Ion-Induced Secondary Electron Yield of Metal Oxide Films on Film Thickness"
  Taku Kawabata

2006

• "Study on Coincidence Detection by using Silicon Drift Detector"
  Hiroshi Kizawa
• "Atomic Level In-Situ Observation of Formation of Graphene Sheet by using Oxide Cobalt Particle"
  Takahiro Yahiro
• "Development of Fast Electron Blanker in Transmission Electron Microscopy"
  Ikuma Yamauchi

2005

• "Effects of Carbon Contaminants on Electron-Induced Damage of SiO₂"
  Takeshi Kuwayama
• "Study on Improvement of Spatial Resolution by using Hollow-cone Illumination in Transmission Electron Microscopy"
  Masahiro Yoshimori

2004

• "Temperature Dependence of Composition of Outermost Surface of Sc-O/W(100) Surface"
  Hajime Inazumi
• "Removal of Focused Ion Beam-Induced Damaged Layer by Sequential Irradiation of Low Energy Ions"
  Kazuhisa Shiraishi
• "Investigation of Electron-Induced Damage of polystyrene Latex by Transimision Electron Microscope"
  Toshihiro Yanai

2003

• "Study on Precision of X-ray Detection Timing of Silicon Drift Detector (SDD)"
  Toshiki Kida
• "Surface Characterization of Sc-O/W(100) System as Schottky Emitter"
  Yousuke Nakanishi
• "Ion-Induced Secondary Electron Emission from MgO Thin Film"
  Katsuhiro Nakayama
• "Study on Direct Detection of Electron by Charge Cpupled Device"
  Souko Fukahori

2002

• "Correction of Image Shift in Floating Type Imaging Energy Filter"
  Hidekazu Chikada
• "Deconvolution of Liner and Nonlinear Component of Transmission Electron Microscope Image"
  Tunenori Nomaguchi
• "Modification of MRI Model in Sputter Depth Profiling"
  Takuya Bungo

2001

• "Study on Three-Dimensional Image Intensity Distribution in Transmission Electron Microscope"
  Masaki Taya
• "Study on Voltage Moduration in Floating-Type Energy Filtered Transmission Electron Microscope"
  Naoto Tokita
• "Study on Acuracy of X-Ray Detection System"
  Misaki Hayashida
• "Measurement of Amplification of Secondary Electron in Enviromental Scanning Electron Microscope (ESEM)"
  Taka-aki Hibi

2000

• "Study on Luminessence from Porus Silicon using Cathod Luminessence Scanning Electron Microscope"
  Tastuya Kojima
• "Study on Real-Time EELS using Floating-Type Energy Filter"
  Yusuke Shimazaki
• "Development of Sealing Film of Enviromental Cell for Transmission Electron Microscope"
  Suguru Toyonaga
• "Study on Accuracy of X-Ray Detection using Si(Li) Detector"
  Ken-ich Nishinaka

1999

• "Deposition of Tungsten in Local Region using Focused Ion Beam"
  Keigo Iwamoto
• "Atomic Level Observation of Interface of Ge/CoSi₂/Si using Transmission Electron Microscope"
  Takumi Ohtomo
• "Quantitative Investigation of Monte Carlo Simulation of X-ray Generation under Electron Beam Bombardment"
  Tomokazu Shimada
• "Coincidence Electron Microscope Observation using Gammma-Type Energy Filter"
  Yukako Higashi
• "Cross-Sectional TEM Observation of SiO₂ Thin Film using Defocus Modulation Method"
  Ko Yamura