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2015”N

  • "Development of a Defocus Modulation Transmission Electron Microscope System for In-situ High Resolution Observation"
    T. Tamura, Y. Kimura and Y. Takai
    10th International Symposium on Atomic Level Characterizations for New Materials and Devices '15 (ALC'15) (Matsue, Japan, October 25-30, 2015) pp.60-61.
  • "Precise Measurement of Specimen Height by 3 Dimensonal Fourier Filtering Method"
    M. Inamori, Y. Kimura and Y. Takai
    10th International Symposium on Atomic Level Characterizations for New Materials and Devices '15 (ALC'15) (Matsue, Japan, October 25-30, 2015) pp.62-63.

2013”N

  • "In-situ HRTEM Observation of Graphen Growth crystalized by Cobalt Nanoparticles"
    T. Tamura and Y. Takai
    9th International Symposium on Atomic Level Characterizations for New Materials and Devices '13 (ALC'13) (Hawaii, USA, December 2-6, 2013) 05P46.

2012”N

  • "Electron Diffraction Analysis of Molybdenum Oxide Crystal Encapsulated inside Individual Carbon Nanotube using Low Electron Dose TEM System"
    R. Sagawa, W. Togashi, T. Akita, and Y. Takai
    10th Asia-Pacific Microscopy Conference (APMC10) (Perth, Australia, February 6-9, 2012) pp. 256-1/2.
  • "High-Resolution Transmission Electron Microscopy Observation of Halloysite using Minimal Dose System"
    K. Mori, T. Kogure, Y. Kimura, and Y. Takai
    10th Asia-Pacific Microscopy Conference (APMC10) (Perth, Australia, February 6-9, 2012) pp. 257-1/2.

2011

  • "Investigation of Effects of Heating in Air on Ionization Potentials of MgO and CaO Films Using Metastable De-Excitation Spectroscopy"
    K. Yoshino, Y. Morita, M. Terauchi, T. Tsujita, Y. Doi, Y. Yamauchi, M. Nishitani, M. Kitagawa, T. Nagatomi, Y. Takai, T. Nakayama, and Y. Yamauchi
    Society For Information Display '11 (SID 2011) (Los Angeles, California, U.S.A., May 15-20, 2011).
  • "Surface Defect Influence on the Ion Induced Secondary Electron Emission Yield from MgO Films"
    Sung Heo, J.G. Chung, H.-I. Lee, J.C. Lee, H.J. Kang, T. Nagatomi and Y. Takai
    8th International Symposium on Atomic Level Characterizations for New Materials and Devices '11 (ALC'11) (Seoul, Republic of Korea, May 22-27, 2011) pp.448-450.
  • "Structure Analysis of Molybdenum Oxide Encapsulated inside Carbon Nanotubes using Low Electron Dose TEM System"
    R. Sagawa, W. Togashi, T. Akita and Y. Takai
    8th International Symposium on Atomic Level Characterizations for New Materials and Devices '11 (ALC'11) (Seoul, Republic of Korea, May 22-27, 2011) pp.546-548.
  • "Unraveling the stacking structures in beam-sensitive clay using a new TEM with computer-assisted minimal-dose system"
    K. Mori, T. Kogure, Y. Kimura, and Y. Takai
    EUROCLAY 2011 (Antalya, Turkey, June 26 - July 1, 2011) p. 286.
  • "Effects of Carbon Contaminations on Electron-Induced Degradation of SiO2"
    T. Nagatomi, H. Nakamura, Y. Takai and S. Tanuma
    14th European Conference on Applications of Surface and Interface Analysis (ECASIA'11) (Cardiff, UK, September 4-9, 2011) p.218.
  • "Effects of Heating in air and Vacuum on Ion-Induced Secondary Electron Yield of MgO Film"
    Y. Murasawa, H. Kataoka, T. Nagatomi, Y. Takai, K. Yoshino, Y. Morita, M. Nishitani and M. Kitagawa
    14th European Conference on Applications of Surface and Interface Analysis (ECASIA'11) (Cardiff, UK, September 4-9, 2011) p.275.
  • "Electron Diffraction Analysis of Molybdenum Oxide Crystal Encapsulated inside Individual Carbon Nanotube"
    R. Sagawa, W. Togashi, T. Akita, and Y. Takai
    4th International Symposium on Atomically Controlled Fabrication Technology (Osaka, Japan, October 31 - November 2, 2011) pp. 216-217.

2010

  • "Mechanism of Secondary Electron Emission"
    T. Nagatomi
    Korea-Japan PDP Forum 2010 (Jeju, Korea, February 20-21, 2010)
  • "High Depth Resolution Auger Depth Profiling Analysis Using a High-Angle Inclined Holder"
    T. Ogiwara, T. Nagatomi, and T. Tanuma
    The 1st Meeting of Korean-Chinese-Japanese Cooperative Program on "Materials Research with Emphasis on Activities Relating to VAMAS" (Deajeon, Korea, March 8-9, 2010) p.15.
  • "How do we determine interface width and interface position of depth profile -Definition in ISO documents and application to practical analysis-"
    T. Nagatomi
    The 1st Meeting of Korean-Chinese-Japanese Cooperative Program on "Materials Research with Emphasis on Activities Relating to VAMAS" (Deajeon, Korea, March 8-9, 2010) p.17.
  • "High Depth Resolution Auger Depth Profiling Analysis Using Inclined Holder"
    T. Ogiwara, T. Nagatomi, and S. Tanuma
    Microscopy & Microanalysis 2010 (Portland, OR, USA, August 1-5, 2010) pp.440-441.
  • "Resolution Improvement Achieved by Three-Dimensional Fourier Filtering Method Applied to Tilted Illumination in TEM"
    F. Nakatani, K. Kitade, and Y. Takai
    17th International Microscopy Congress (IMC 17) (Rio, Brazil, September 19-24, 2010) I2.27.
  • "Study on Molybdenum Oxide Encapsulated inside Carbon Nanotubes Using Transmission Electron Microscope"
    R. Sagawa, W. Togashi, T. Akita, and Y. Takai
    17th International Microscopy Congress (IMC 17) (Rio, Brazil, September 19-24, 2010) M2.29.
  • "TEM Observation of Surface Atomic Structure of Cobalt Nanocatalysts Producing Graphite"
    T. Yahiro and Y. Takai
    17th International Microscopy Congress (IMC 17) (Rio, Brazil, September 19-24, 2010) M7.21.
  • "Effects of Heating in Air on Metastable De-Excitation Spectroscopy Spectra of MgO and CaO Films"
    K. Yoshino, Y. Morita, M. Nishitani, T. Nagatomi, Y. Takai, and Y. Yamauchi
    5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10) (Gyeongju, Korea, October 3-7, 2010) p.89
  • "High Depth Resolution Auger Depth Profiling using a 85‹-High-Angle Inclined Holder"
    T. Ogiwara, T. Nagatomi, K. J. Kim and S. Tanuma
    5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10) (Gyeongju, Korea, October 3-7, 2010) p.115
  • "Measurement of Secondary Electron Yield by Charge Amplification Method"
    T. Miyagawa, M. Inoue, T. Iyasu, Y. Hashimoto, K. Goto, R. Shimizu and T. Nagatomi
    5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10) (Gyeongju, Korea, October 3-7, 2010) p.118
  • "Band Alignment and Defect States in Amorphous Si-N Compounds on Si Substrates"
    S. Heo, J.G. Chung, H.I. Lee, J.C. Lee, G.S. Park, D. Tahir, S.K. Oh, H.J. Kang, T. Nagatomi and Y. Takai
    5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10) (Gyeongju, Korea, October 3-7, 2010) p.150
  • "Surface Defect States of MgO Films"
    S. Heo, J.G. Chung, H.I. Lee, J.C. Lee, G.S. Park, D. Tahir, S.K. Oh, H.J. Kang, T. Nagatomi and Y. Takai
    5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10) (Gyeongju, Korea, October 3-7, 2010) p.175.
  • "Change in Ion-Induced Secondary Electron Yield of MgO Film Caused by Heating in Air"
    Y. Murasawa, J. Azargal, K. Yoshino, T. Nagatomi, Y. Takai, Y. Morita and M. Nishitani
    5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10) (Gyeongju, Korea, October 3-7, 2010) p.176.
  • "High-Sensitive Depth Profiling Analyses of Delta-Doped Layers Specimens with Glancing Angle Irradiation and Detection Method"
    H. Tanishiki, T. Ogiwara, T. Nagatomi, Y. Takai, K. J. Kim and S. Tanuma
    5th International Symposium on Practical Surface Analysis and 7th Korea-Japan International Sumposium on Surface Analysis (PSA-10) (Gyeongju, Korea, October 3-7, 2010) p.194.
  • "Determination of IMFP, SEP and DSEP by absolute REELS analysis"
    T. Nagatomi
    Hungarian-Japanese Joint Working Seminar on Studies of Fundamental Parameter Database and Atomic Processes for High Precision Quantitative Analysis using X-Ray Photoelectron Spectroscopy (in the frame of the bilateral MTA-JSPS scientific research cooperation project) (MTA ATOMKI, Debrecen, Hungary, October 27, 2010)
  • "TEM Observation of Surface Atomic Structure of Cobalt Nanocatalysts Producing Graphite"
    T. Yahiro and Y. Takai
    3rd International Symposium on Atomically Controlled Fabrication Technology (Osaka, Japan, November 24-26, 2010) pp.176-177.
  • "Study on Molybdenum Oxide Encapsulated inside Carbon Nanotubes Using Transmission Electron Microscope"
    R. Sagawa, W. Togashi, T. Akita, and Y. Takai
    3rd International Symposium on Atomically Controlled Fabrication Technology (Osaka, Japan, November 24-26, 2010) pp.202-203.

2009

  • "Influences of Measurement Conditions on Etching Rate of GaAs/AlAs Superlattice in Auger Electron Spectroscopy Sputter Depth Profiling"
    T. Nagatomi, T. Bungo, and Y. Takai
    International Workshop for Surface Analysis and Standardization '09 (iSAS-09) (Okinawa, Japan, March 15-18, 2009) pp. 329-332.
  • "Influence of Wall Charges on Electron Emission from MgO Layer in AC-PDP"
    T. Nagatomi
    Japan-Korea PDP Forum '09 (Kyoto, Japan, July 11, 2009) pp. 181-206.
  • "Electron Inelastic Mean Free Path and Surface Excitation Parameter in 10 Elemental Solids Determined by Absolute REELS analysis over 300-3000 eV Range"
    T. Nagatomi, S. Tanuma, and K. Goto
    13th European Conference on Application of Surface and Interface Analysis (ECASIA'09) (Antalya, Turkey, October 18-23, 2009) p.244-244.
  • "In Situ Measurement of Surface Potential Induced on MgO Thin Film Surface under Ion Irradiation using Ion Scattering Spectroscopy
    T. Nagatomi, T. Kuwayama, K. Yoshino, Y. Morita, M. Nishitani, M. Kitagawa, and Y. Takai
    5th International Workshop on High-Resolution Depth Profiling (HRDP-5) (Kyoto, Japan, Nobember 15-19, 2009) p.69-69.
  • "Working Group Report of Database Construction of Secondary Electron Yield (JSPS141-WG-SEY) [I] Precise Measurement by Charge Amplification Method"
    T. Nagatomi, K. Goto, R. Shimizu, and Members of JSPS141-WG-SEY
    7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09 (ALC'09) (Hawaii, USA, Dec. 6-11, 2009) pp.225-228.
  • "Absolutely Determined Inelastic Mean Free Pathes for 300-3000 eV Electrons in 10 Elemental Solids"
    T. Nagatomi, S. Tanuma, and K. Goto
    7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09 (ALC'09) (Hawaii, USA, Dec. 6-11, 2009) pp.229-232.
  • "Direct Electron Detection by CCD Device for TEM Imaging"
    Y. Kimura, H. Kizawa, M. Hayashida, T. Iyasu, T. Maruno, K. Hara, S. Isakozawa, H. Yumen, and K. Sato
    7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09 (ALC'09) (Hawaii, USA, Dec. 6-11, 2009) pp.237-238.
  • "Development of Computer Assisted Imaging System for TEM with Direct Electron Detection Type CCD Camera"
    H. Kizawa, W. Togashi, M. Hayashida, Y. Kimura, and Y. Takai
    7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09 (ALC'09) (Hawaii, USA, Dec. 6-11, 2009) pp.239-240.
  • "Three-Dimensional Fourier Filtering Method Applied to Tilted Illumination"
    F. Nakatani, K. Kitade, and Y. Takai
    7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09 (ALC'09) (Hawaii, USA, Dec. 6-11, 2009) pp.241-242.
  • "Development of Electron Optical System Using Annular Pupils for Scanning Transmission Electron Microscope"
    T. Matsutani, M. Taya, T. Tanaka, Y. Kimura, Y. Takai, T. Kawasaki, M. Ichihashi, and T. Ikuta
    7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09 (ALC'09) (Hawaii, USA, Dec. 6-11, 2009) pp.245-248.
  • "Towards Automatic Electron Tomography for Rod-Shaped Specimen"
    M. Hayashida, Y. Kimura, and T. Fujimoto
    7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09 (ALC'09) (Hawaii, USA, Dec. 6-11, 2009) pp.249-252.
  • "In-situ High-resolution TEM Observation of Graphite Formation using Cobalt Oxide Nanoparticles"
    T. Yahiro and Y. Takai
    7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09 (ALC'09) (Hawaii, USA, Dec. 6-11, 2009) pp.331-332.

2008

  • "Surface Excitation Parameter and Inelastic Mean Free Path in Au for 300 to 3000 eV Electrons"
    T. Nagatomi and K. Goto
    The 55th IUVSTA Workshop on Electron Transport Parameters Applied in Surface Analysis (Siofok, Hungary, September 14-17, 2008) pp.33-34.
  • "Ion-Induced Secondary Electron Emission and Charging of MgO Thin Film"
    T. Nagatomi
    Korea-Japan PDP Forum (Seoul, Korea, October 18-19, 2008).
  • "Change in Work Function during Phase Transition of Sc-O/W(100) System at High Temperature"
    Y. Nakanishi, T. Nagatomi and Y. Takai
    4th Vacuum and Surface Science Conference of Asia and Australia (VASSCAA-4) (Matsue, Japan, October 28-31, 2008) p.129.
  • "Inelastic Mean Free Path and Surface Excitation Parameter in Au for 300 to 3000 eV Electrons"
    T. Nagatomi and K. Goto
    4th Vacuum and Surface Science Conference of Asia and Australia (VASSCAA-4) (Matsue, Japan, October 28-31, 2008) p.136.
  • "Visulalization of Nanoscaled Organic Multilayer by Low-Voltage STEM"
    T. Ueda, A. Makino, and Y. Takai
    The 9th Asia-Pasific Microscopy Conference (APMC9) (Jeju, Korea, November 2-7, 2008) p.12.
  • "Focul Depth Extension by Hollow-cone Illumination with Annular Pupil to Obtain Potential Projected Images for STEM Tomography"
    T. Kawasaki, T. Matsutani, M. Taya, Y. Kimura, M. Ichihashi, and T. Ikuta
    The 9th Asia-Pasific Microscopy Conference (APMC9) (Jeju, Korea, November 2-7, 2008) p.55.
  • "Dynamic TEM Observation of Graphite Formation using Transition Metal Oxide Nanocatalysts"
    Y. Takai, T. Yahiro, and T. Kida
    The 9th Asia-Pasific Microscopy Conference (APMC9) (Jeju, Korea, November 2-7, 2008) p.58.
  • "Wave Field Reconstruction under Critial Low Electron Dose Conditions: Comparison of SWFM and 3D-FFM"
    Y. Takai, T. Nomaguchi, and Y. Kimura
    The 9th Asia-Pasific Microscopy Conference (APMC9) (Jeju, Korea, November 2-7, 2008) p.79.
  • "Aberration-Free Imaging by Dynamic Hollow-cone Illumination in Transmission Electron Microscopy"
    K. Kitade, H. Yoshimori, T. Ikuta, Y. Kimura, and Y. Takai
    The 9th Asia-Pasific Microscopy Conference (APMC9) (Jeju, Korea, November 2-7, 2008) p.87.
  • "Aberration-Free STEM Imaging System Incorporating Parallel Detection and Processing Techniques Using a Multidetector Array"
    Y. Takai, M. Taya, Y. Kimura, and T. Ikuta
    The 9th Asia-Pasific Microscopy Conference (APMC9) (Jeju, Korea, November 2-7, 2008) p.87.
  • "Development of Direct Single Electron Detection Type CCD Camera for Transmission Electron Microscope"
    Y. Kimura, M. Hayashida, T. Iyasu, T. Nagatomi, T. Maruno, and K. Hara
    The 9th Asia-Pasific Microscopy Conference (APMC9) (Jeju, Korea, November 2-7, 2008) p.87.
  • "In-situ TEM Observation of Graphite Formation Using Cobalt Oxide Nanocrystals"
    T. Yahiro and Y. Takai
    The 9th Asia-Pasific Microscopy Conference (APMC9) (Jeju, Korea, November 2-7, 2008) p.129.
  • "Optimum Observation Condition for High Resolution X-ray Microscopy"
    Y. Yamaguchi, Y. Kimura and R. Shimizu
    The 9th Asia-Pasific Microscopy Conference (APMC9) (Jeju, Korea, November 2-7, 2008) p.132.
  • "Practical Surface Analysis of MgO Thin Films Used for Plasma Display Panel"
    T. Nagatomi
    2008 Current Status and Development of Surface Characterization in Nanotechnology and Materials Research (Taiwan, December 1-3, 2008) p.25.
  • "Influences of Wall Charges on Electron Emissions from MgO Protective Layer"
    K. Yoshino, T. Nagatomi, Y. Morita, N. Kosugi, T. Oue, M. Nishitani, M. Kitagawa, and Y. Takai
    The 15th International Display Workshops (IDW'08) (Niigata, Japan, December 3-5, 2008) pp.1873-1876.
  • "Afternoom Panel Sessions "Towards the Continuous Growht of PDPs" (2) Protective layer"
    T. Nagatomi
    PDP International Forum'08 -IDW'08 Satellite Forum- (The 50th Plasma Display Technical Meeting) (Niigata, Japan, December 6, 2008) (Panelist).

2007

  • "Dependence of Ion-Induced Secondary Electron Yield of MgO Thin Films on Film Thickness"
    T. Nagatomi, H. Inazumi, Y. Takai, K. Yoshino, Y. Morita, M. Nishitani, and M. Kitagawa
    12th European Conference on Application of Surface and Interface Analysis (ECASIA'07) (Brussels, Belgium, September 9-14, 2007) p.250-250.
  • "Auger Spectrum Analysis of S-O/W(100) Surface during Phase Transition at High Temperature"
    Y. Nakanishi, T. Nagatomi, and Y. Takai
    12th European Conference on Application of Surface and Interface Analysis (ECASIA'07) (Brussels, Belgium, September 9-14, 2007) p.301-301.
  • "Wave Field Restoration Methods in Electron Microscopy Based on Three-Dimensional Optical Transfer Properties"
    Y. Takai and Y. Kimura
    6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07) (Kanazawa, Japan, October 28-November 2, 2007) p.10-10.
  • "Interpretation of Cs-Corrector System with Twin Hexapoles and Transfer Doublet Based on Geometrical Optics Theory"
    T. Kawasaki, M. Ichihashi, T. Nakamura, T. Kawasaki, T. Matsutani, Y. Kimura, and T. Ikuta
    6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07) (Kanazawa, Japan, October 28-November 2, 2007) p.25-25.
  • "Metrological Evaluation of Signal Formation in CD-SEM -A Quantitative Cpmputer Simulation-"
    T. Iyasu, Y. Kimura, N. Anazawa and R. Shimizu 6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07) (Kanazawa, Japan, October 28-November 2, 2007) p.27-27.
  • "Development of Aberration-Free Phase Imaging System using A Detector Array And An Annular Pupil in Scanning Transmission Electron Microscopy"
    M. Taya, T. Ikuta, T. Matsutani, T. Tanaka, K. Ogai, Y. Harada, H. Saito, and Y. Takai
    6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07) (Kanazawa, Japan, October 28-November 2, 2007) p.30-30.
  • "Restoration of Phase And Amplitude Components using Dynamic Hollow-cone Illumination in Transmission Electron Microscopy"
    H. Yoshimori, M. Taya, T. Ikuta, and Y. Takai
    6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07) (Kanazawa, Japan, October 28-November 2, 2007) p.31-31.
  • "A Process for Exit Wave Reconstruction using Through-Focus Series of Images Taken under Critical Low Electron Dose Conditions"
    T. Nomaguchi, Y. Kimura, and Y. Takai
    6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07) (Kanazawa, Japan, October 28-November 2, 2007) p.32-32.
  • "Measurement of Precision for Developing Automatic Transmission Electron Microscope"
    M. Hayashida, Y. Kimura, and Y. Takai
    6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07) (Kanazawa, Japan, October 28-November 2, 2007) p.35-35.
  • "Development of Annular Pupil for Electron Optics by Focused Ion Beam Technique"
    T. Matsutani, M. Taya, T. Ikuta, M. Fujiwara, T. Tanaka, Y. Kimura, Y. Takai, T. Kawasaki, and M. Ichihashi
    6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07) (Kanazawa, Japan, October 28-November 2, 2007) p.36-36.
  • "Inelastic Mean Free Path and Surfacde Excitation Parameter in Ni for Medium-Energy Electrons Deetemined by Absolute Reflection Electron-Energy Loss Spectrum Analysis"
    T. Nagatomi and K. Goto
    6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07) (Kanazawa, Japan, October 28-November 2, 2007) p.66-66.
  • "Measurement of Surface Potential of MgO Film under Ion Irradation by Ion Scattering Spectroscopy"
    T. Kuwayama, T. Nagatomi, Y. Takai, K. Yoshino, Y. Morita, M. Nishitani, and M. Kitagawa
    6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07) (Kanazawa, Japan, October 28-November 2, 2007) p.98-98.
  • "Surface Chemical State Analysis of Sc-O/W(100) System during Phase Transition at High Temperature"
    Y. Nakanishi, T. Nagatomi, and Y. Takai
    6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07 (ALC'07) (Kanazawa, Japan, October 28-November 2, 2007) p.121-121.
  • "Effects of Oxygen Atmosphere on Electron-Induced Damage of SiO2"
    H. Nakamura, T. Nagatomi, and Y. Takai
    4th International Symposium on Practical Surface Analysis and 6th Korea-Japan International Sumposium on Surface Analysis (PSA-07) (Kanazawa, Japan, November 25-28, 2007) p.P-18-P-18.
  • "Application of Ion Scattering Spectroscopy to Measurement of Surface Potential of MgO Film during Ion Irradiation"
    T. Kuwayama, T. Nagatomi, Y. Takai, K. Yoshino, Y. Morita, M. Nishitani, and M. Kitagawa
    4th International Symposium on Practical Surface Analysis and 6th Korea-Japan International Sumposium on Surface Analysis (PSA-07) (Kanazawa, Japan, November 25-28, 2007) p.P-49-P-49.
  • "Surface Potential and Secondary Electron Yield of MgO Thin Film of 50 nm Thickness under Ion Irradiation"
    T. Nagatomi, K. Yoshino, Y. Morita, M. Nishitani, M. Kitagawa, and Y. Takai
    The 14th International Display Workshops (IDW'07) (Sapporo, Japan, December 5-7, 2007) pp.181-184.

2006

  • "In-situ High-Resolution TEM Observation of Graphite formation Using Iron Oxide Particles"
    T. Kida and Y. Takai
    The 3rd China-Japan Joint Seminar on Atomic Level Characterizetion (China, March, 2006) pp.44-44.
  • "Development of High-Resolution Bio Phase Transmission Electron Microscope Based on Defocus Image Modulation Processing (Plenary Lecture)"
    Y. Takai, M. Hayashida , T. Nomaguchi and Y. Kimura
    The 3rd China-Japan Joint Seminar on Atomic Level Characterizetion (China, March, 2006) pp.569-572.
  • "Observation of Individual DNA Molecular Structures using Transmission Electron Microscope under Low-Dose Conditions"
    T. Nomaguchi, M. Hayashida, Y. Kimura and Y. Takai
    16th International Microscopy Congress (IMC16) (Sapporo, Japan, Sep. 3-8, 2006) pp.944-944.
  • "Construction of Parallel Processing System in STEM using A Multiple Detector Array for Aberration-Free Phase Imaging"
    M. Taya, T. Ikuta, H. Saito, K. Ogai, T. Tanaka, and Y. Takai
    16th International Microscopy Congress (IMC16) (Sapporo, Japan, Sep. 3-8, 2006) pp.966-966.
  • "Development of The Computer-Emulated Low-Dose System"
    M. Hayashida, T. Nomaguchi, Y. Kimura and Y. Takai
    16th International Microscopy Congress (IMC16) (Sapporo, Japan, Sep. 3-8, 2006) pp.1072-1072.
  • "Development of Super-coherent Bio Phase Transmission Electron Microscope"
    Y. Takai, Y. Kimura, T. Furutu, and Y. Taniguchi
    16th International Microscopy Congress (IMC16) (Sapporo, Japan, Sep. 3-8, 2006) pp.1136-1136.
  • "Observation of Surfaces by using Spherical Aberration-free Phase TEM"
    Y. Takai
    16th International Microscopy Congress (IMC16) (Sapporo, Japan, Sep. 3-8, 2006) pp.1314-1314.
  • "In-situ High-Resolution TEM Observation of Graphite Formation using Iron Oxide Nanoparticles"
    Y. Takai and T. Kida
    16th International Microscopy Congress (IMC16) (Sapporo, Japan, Sep. 3-8, 2006) pp.1583-1583.
  • "Surface Excitation Parameters And Inelastic Mean Free Paths in Ni for 300 to 3000 eV Electrons Absolutely Determined by REELS Analysis"
    T. Nagatomi
    Workshop "Modeling And Data for Electron Spectroscopies: Standardization of Surface Analysis Techniques"(Brussels, Bergium, September 13-15, 2006) pp.16-16.
  • "Simultaneous Determination of Surface Excitation Parameter and Inelastic Mean Free Path with Absolute Units Using Reflection Electron Energy Loss Spectrum"
    T. Nagatomi and K. Goto
    Joint Vacuum Conference 11 (JVC 11) (Prague, Czech Republic, September 24-28, 2006) pp.48-48.

2005

  • "Atomic Level Characterization Based on Focus Modulation Electron Microscopy"
    Y. Takai, M. Taya, H. Chikada and Y. Kimura
    9th EMAS European Workshop on Modern Developments and Applications in Microbeam Analysis (EMAS 2005) and 3rd Meeting of the International Union of Microbeam Analysis Societies (IUMAS-3) (Florence, Italy, May, 2005) pp.41-52.
  • "Surface Excitations in Ni and Au studied by REELS Analysis"
    T. Nagatomi
    Europian Conference on Applications of Surface and Interface Analysis (ECASIA'05) (Vienna, Austria, Sept. 25-30, 2005) pp.103-103.
  • "Dependecce of Depth Resolution in Sputter Depth Profiling on Primary Energy of Low-Energy Ions"
    T. Bungo, T. Nagatomi and Y. Takai
    International Symposium on Surface Science and Nanotechnology (ISSS-4) (Saitama, Japan, Nov. 14-17, 2005) pp.148-148.
  • "Reversible Phase Transition on Sc-O/W(100) Surface at High Temperature"
    Y. Nakanishi, T. Nagatomi and Y. Takai
    International Symposium on Surface Science and Nanotechnology (ISSS-4) (Saitama, Japan, Nov. 14-17, 2005) pp.173-173.
  • "Dependence of Depth Resolution on Primary Energy of Low-Energy Ar+Ions (100-1000 eV) in AES Sputter Depth Profiling of GaAs/AlAs Superlattice"
    T. Bungo, T. Nagatomi, and Y. Takai
    5th International Symposium on Atomic Level Characterizations for New Materials and Devices '05 (ALC'05) (Hawaii, USA, Dec. 4-9, 2005) pp.436-440.
  • "Determination of Inelastic Mean Free Path And Surface Excitation Parameter by Analysis of Absolute Reflection Electron Energy Loss Spectra"
    T. Nagatomi and K. Goto
    5th International Symposium on Atomic Level Characterizations for New Materials and Devices '05 (ALC'05) (Hawaii, USA, Dec. 4-9, 2005) pp.453-455.
  • "Effects of Oxygen Atmosphere on Surface Properties of Sc-O/W(100) System as Schottky Emitter at Hight Temperature"
    Y. Nakanishi, T. Nagatomi, and Y. Takai
    5th International Symposium on Atomic Level Characterizations for New Materials and Devices '05 (ALC'05) (Hawaii, USA, Dec. 4-9, 2005) pp.456-459.
  • "Development of High-resolution Bio Phase Transmission Electron Microscope"
    Y. Takai, M. Hayashida, T. Nomaguchi, and Y. Kimura
    5th International Symposium on Atomic Level Characterizations for New Materials and Devices '05 (ALC'05) (Hawaii, USA, Dec. 4-9, 2005) pp.569-572.
  • "Development of The Computer-Emulated Low-Does System with Beam Blanker in TEM"
    M. Hayashida, Y. Kimura, and Y. Takai
    5th International Symposium on Atomic Level Characterizations for New Materials and Devices '05 (ALC'05) (Hawaii, USA, Dec. 4-9, 2005) pp.573-576.
  • "Phase Observation of DNA Molecular Structure Using Three-Dimensional Fourier Filtering Method under Low Dose Conditions"
    T. Nomaguchi, Y. Kimura, and Y. Takai
    5th International Symposium on Atomic Level Characterizations for New Materials and Devices '05 (ALC'05) (Hawaii, USA, Dec. 4-9, 2005) pp.577-581.
  • "Development of Coincidence Transmission Electron Microscope -Observation of Coincidence Image Using Waveform Measurement System"
    K. Nishinaka, Y. Kimura, and Y. Takai
    5th International Symposium on Atomic Level Characterizations for New Materials and Devices '05 (ALC'05) (Hawaii, USA, Dec. 4-9, 2005) pp.619-622.
  • "Development of An Aberration-Free Phase Imaging System in STEM Using A Multidetector Array"
    M. Taya, T. Ikuta, H. Saito, K. Ogai, T. Tanaka, and Y. Takai
    5th International Symposium on Atomic Level Characterizations for New Materials and Devices '05 (ALC'05) (Hawaii, USA, Dec. 4-9, 2005) pp.623-625.

2004

  • "Auger Electron Spectroscopy Sputter Depth Profiling of ISO Reference Material of GaAs/AlAs Superlattice Using Low-Energy Ions"
    T. Bungo, Y. Mizuhara, T. Nagatomi and Y. Takai
    1st International Symposium on Standard Materials And Metrology for Nanotechnology (SMAM-1) (Tokyo, Japan, March. 15-16, 2004) pp32.
  • "Analysis of Multiple BN Delta-Doped Layers by Work Function measurement"
    Y. Mizuhara, T. Bungo, T. Nagatomi and Y. Takai
    1st International Symposium on Standard Materials And Metrology for Nanotechnology (SMAM-1) (Tokyo, Japan, March. 15-16, 2004) pp42.
  • "Removal of FIB-Induced Damaged Layer by Low-energy Ar+ ion Irradiation"
    J. Kato, T. Nagatomi and Y. Takai
    8th Asia-Pacific Conference on Electron Microscopy (8APEM) (Kanazawa, Japan, June 7-11, 2004) pp242-243.
  • "Aberration-free Phase Images of DNA Observed by Phase Transmission Electron Microscopy"
    Y. Takai, S. Matsushita, T. Nomaguchi, Y. Kimura, Y. Satou and S. Isakozawa
    8th Asia-Pacific Conference on Electron Microscopy (8APEM) (Kanazawa, Japan, June 7-11, 2004) pp276-277.
  • "Recent Progress on Dynamic Observation of Movement of Atoms by TEM"
    Y. Takai
    8th Asia-Pacific Conference on Electron Microscopy (8APEM) (Kanazawa, Japan, June 7-11, 2004) pp325-326.
  • "Acceleration Voltage Dependences of Irradiation Damage and Image Contrast in Transmission Electron Microscopy"
    M. Hayashida, T. Kawasaki, Y. Kimura and Y. Takai
    8th Asia-Pacific Conference on Electron Microscopy (8APEM) (Kanazawa, Japan, June 7-11, 2004) pp724-725.
  • "Effects of Surface Excitations Deduced from Reflection Electron Energy Loss Spectra"
    T. Nagatomi
    IUVSTA (International Union of Vacuum Science, Technique and Applications) Workshop on Electron Scattering in Solids (ESS'04) - From Fundamental Concepts to Practical Applications (Debrecen, Hungary, July 4-8, 2004) pp.33-33.
  • "Surface Excitation Parameter Obtained by REELS Analysis"
    T. Nagatomi
    3rd International Symposium of Practical Surface Analysis (PSA-04) (Jeju, Korea, October 4-6, 2004) pp.37-37.
  • "Application of Low-Energy Ion to Removal of Focused Ion Beam-Induced Damaged Layer"
    J. Kato, T. Nagatomi and Y. Takai
    3rd International Symposium of Practical Surface Analysis (PSA-04) (Jeju, Korea, October 4-6, 2004) pp.137-137.
  • "Primary Energy Dependence of Depth Resolution in AES Sputter Depth Profiling of GaAs/AlAs Superlattice"
    T. Bungo, Y. Mizuhara, T. Nagatomi and Y. Takai
    3rd International Symposium of Practical Surface Analysis (PSA-04) (Jeju, Korea, October 4-6, 2004) pp.138-138.
  • "Phase Transition at Sc-O/W(100) Surface at High Temperature"
    Y. Nakanishi, T. Nagatomi and Y. Takai
    3rd International Symposium of Practical Surface Analysis (PSA-04) (Jeju, Korea, October 4-6, 2004) pp.139-139.
  • "Auger Electron Spectroscopy Sputter Depth Profiling of the GaAs/AlAs Superlattice material using Low-Energy Ar+Ions"
    T. Bungo, Y. Mizuhara, T. Nagatomi and Y. Takai
    15th International Workshop on Inelastic Ion-Surface Collisions (IISC-15) (Mie, Japan, October 17-22, 2004) pp.32-32.
  • "Removal of Focused Ion Beam-Induced Damaged Layer by Low-Energy Ion Irradiation"
    J. Kato, T. Nagatomi and Y. Takai
    15th International Workshop on Inelastic Ion-Surface Collisions (IISC-15) (Mie, Japan, October 17-22, 2004) pp.50-50.
  • "Monte Carlo Modeling of Electron-Excited X-Ray Emission from Bulk Materials and Thin-Film/Substrate Systems"
    T. Nagatomi
    Workshop on Modeling Electron Transport for Application in Electron And X-ray Analysis And Metrology (NIST, Gaithersburg, Maryland, USA, Nobember 8-10, 2004) pp.15-15.

2003

  • "Self-Recovery Function of Sc-O/W(100) System as Schottky Emitter"
    S. Iida, T. Nagatomi and Y. Takai
    4th International Symposium on Atomic Level Characterization for New Material and Deveices '03 (ALC '03) (Kauai, Hawaii, USA, Oct. 5-10, 2003) pp17-17.
  • "Transmission Electron Microscopy Study of Low-Energy Ion Induced Damaged Layer"
    J. Kato, T. Nagatomi and Y. Takai
    4th International Symposium on Atomic Level Characterization for New Material and Deveices '03 (ALC '03) (Kauai, Hawaii, USA, Oct. 5-10, 2003) pp54-54.
  • "Ion Induced Secondary Electron Emission from MgO Thin Film"
    T. Tsujita, T. Nagatomi and Y. Takai
    4th International Symposium on Atomic Level Characterization for New Material and Deveices '03 (ALC '03) (Kauai, Hawaii, USA, Oct. 5-10, 2003) pp55-55.
  • "Development of Ultrahigh Vacuum Floating-Type Low-Energy Ion Gun with Differential Pumping Facilities for High Resolution Depth Profiling"
    Y. Mizuhara, T. Bungo, T. Nagatomi, Y. Takai, S. Suzuki, K. Kikuchi, T. Sato and K. Uta
    4th International Symposium on Atomic Level Characterization for New Material and Deveices '03 (ALC '03) (Kauai, Hawaii, USA, Oct. 5-10, 2003) pp56-56.
  • "Development of Coincidence Transmission Electron Microscope -Application of Waveform Measurement System"
    K. Nishinaka, Y. Kimura and Y. Takai
    4th International Symposium on Atomic Level Characterization for New Material and Deveices '03 (ALC '03) (Kauai, Hawaii, USA, Oct. 5-10, 2003) pp132-132.
  • "Spherical Aberration-Free Phase Observation of Si/SiO2Interface"
    M. Taya, H. Kutsubo, T. Kawasaki and Y. Takai
    4th International Symposium on Atomic Level Characterization for New Material and Deveices '03 (ALC '03) (Kauai, Hawaii, USA, Oct. 5-10, 2003) pp133-133.
  • "Surface Structural Analysis of Zr-O/W(100) Emitter at High Temperature by X-ray Photoelectron Diffraction"
    K. Tamura, M. Amano, W.G. Chu, H. Ishii, M. Owari, T. Kawano, T. Nagatomi, Y. Takai, C. Oshima, R. Shimizu and Y. Nihei
    4th International Symposium on Atomic Level Characterization for New Material and Deveices '03 (ALC '03) (Kauai, Hawaii, USA, Oct. 5-10, 2003) pp135-135.
  • "Development of Real-Time Elemental Mapping System using Floating-Type Imaging Energy Filter"
    Y. Kimura, Y. Shimazaki, N. Tokita, K. Nishikata and Y. Takai
    4th International Symposium on Atomic Level Characterization for New Material and Deveices '03 (ALC '03) (Kauai, Hawaii, USA, Oct. 5-10, 2003) pp136-136.
  • "High Resolution Observation of DNA by Phase Transmission Electron Microscopy"
    M. Hayashida, K. Takenouch, S. Matsushita, Y. Kimura and Y. Takai
    4th International Symposium on Atomic Level Characterization for New Material and Deveices '03 (ALC '03) (Kauai, Hawaii, USA, Oct. 5-10, 2003) pp137-137.
  • "Phase Transmission Electron Microscopy with Aberration Correction Based on Active Defocus Modulation"
    Y. Takai, T. Kawasaki and Y. Kimura
    4th International Symposium on Atomic Level Characterization for New Material and Deveices '03 (ALC '03) (Kauai, Hawaii, USA, Oct. 5-10, 2003) pp182-182.
  • "Energy Distribution of Ion-Induced Secondary Electron Emission from MgO Thin Films"
    T. Tsujita, T. Nagatomi, Y. Takai, Y. Morita, M. Nishitani, M. Kitagawa and T. Uenoyama
    Proceedings of The 10th International Display Workshops (IDW '03) (Fukuoka, Japan, Dec. 3-5, 2003) pp881-884.

2002

  • "Energy Loss Functions Derived by Monte Carlo Simulation Analysis - Extended Landau Formulation as Applied to Surface Electron Spectroscopy -"
    R. Shimizu, T. Nagatomi and K. Goto
    The second Japan-Hungary Joint Seminar on Physics in Modern Science and Technology Frontier of Photon Science (Recearch Center for Nuclear Physics, Osaka University; Japan Synchrotron Radiation Research Institute; Kansai Research Establishment, Japan Atomic Energy Research Institute; International Institute for Advanced Studies; Japan, May 13-17, 2002) pp114-121.
  • "Development of Ultrahigh Vacuum Floating-Type Low Energy Ion Gun for High Resolution Depth Profiling of Shallow Doped Layer"
    Y. Mizuhara, J. Kato, T. Nagatomi, Y. Takai, T. Aoyama, A. Yoshimoto, M. Inoue and R. Shimizu
    12th International Conference on Quantitative Surface & Nanoanalysis (QSnA-12) (University of Surrey, Guilford, UK, July 8-11, 2002) pp11-11.
  • "Characterization of Sc-O/W(100) Schottky Emitter at High Temperatures: -LEED Observation and Quantitative AES Analysis-"
    T. Nagatomi, S. Iida, T. Tsujita and Y. Takai
    12th International Conference on Quantitative Surface & Nanoanalysis (QSnA-12) (University of Surrey, Guilford, UK, July 8-11, 2002) pp13-13.
  • "Characterization of Sc-O/W(100) Schottky Emitter at High Temperatures: -AES, ISS and Work Function Measurement-"
    T. Tsujita, S. Iida, T. Nagatomi and Y. Takai
    12th International Conference on Quantitative Surface & Nanoanalysis (QSnA-12) (University of Surrey, Guilford, UK, July 8-11, 2002) pp52-52.
  • "Principles of Phase Reconstruction with Aberration Correction Using Three-Dimensional Fourier Filtering Method"
    T. Kawasaki and Y. Takai
    Proc. of Microscopy and Microanalysis 2002 (M&M 2002) (Quebec, Canada, Aug. 5-8, 2002) pp.474-475.
  • "Dynamic Observation of an Atom-Sized Gold Wire by Real-Time Defocus Image Modulation Processing Electron Microscope"
    Y. Takai, T. Kawasaki and Y. Kimura
    Proc. of Microscopy and Microanalysis 2002 (M&M 2002) (Quebec, Canada, Aug. 5-8, 2002) pp.482-483.
  • "Single Atom Dynamism Observed by Real-Time Defocus-Image Modulation Processing Electron Microscope"
    Y. Takai, T. Kawasaki and Y. Kimura
    Proc. of 15th International Congress on Electron Microscopy (ICEM15) (Durban, South Africa, Sept. 1-6, 2002) Vol.3 pp.203-204.
  • "Dynamic Observation of Surface Atom Movement Using High-Speed Image Processing CCD Video Camera"
    K. Nishikata, T. Kawasaki, Y. Kimura and Y. Takai
    Proc. of 15th International Congress on Electron Microscopy (ICEM15) (Durban, South Africa, Sept. 1-6, 2002) Vol.3 pp.363-364.
  • "Quantitative Analysis of Phase Image Reconstructed by Three-Dimensional Fourier Filtering Method"
    Y. Takai, T. Kawasaki and Y. Kimura
    Proc. of 15th International Congress on Electron Microscopy (ICEM15) (Durban, South Africa, Sept. 1-6, 2002) Vol.3 pp.435-436.
  • "Spherical Aberration-Free Phase Electron Microscope: Application to Dynamic Observation of Surface Atom Movement"
    Y. Takai, K. Nishikata, T. Kawasaki and Y. Kimura
    2nd Japan-China Joint Seminor on Atomic Level Characterization '02 (Guilin, Nov. 4-8, 2002) pp.10-13
  • "A Novel Ultrahigh Vacuum Floating-Type Low Energy Ion Gun for High Resolution Depth Profiling"
    Y. Mizuhara, M. Inoue, T. Nagatomi, Y. Takai and R. Shimizu
    2nd Japan-China Joint Seminor on Atomic Level Characterization '02 (Guilin, Nov. 4-8, 2002) pp.93-97.
  • "Surface Properties of Sc-O/W(100) System as Emitter at Room and High Temperatures"
    S. Iida, T. Tsujita, T. Nagatomi and Y. Takai
    Abstracts of The 4th Korea-Japan International Symposium on Surface Analysis (Hiroshima, Japan, Nov. 18-19, 2002)

2001

  • "Effective Energy Loss Functions for Al, Cu, Ag and Au"
    T. Nagatomi, Y. Takai and K. Goto
    9th European Conference on Applications of Surface and Interface Analysis (ECASIA '01) (Avignon, France, Sep. 30-Oct. 5, 2001) pp.176-176.
  • "Quantitative Measurement of Amount of Charging in Insulator Sample under Electron Beam Irradiation"
    Y. Mizuhara, T. Nagatomi, Y. Kimura, Y. Takai and M. Inoue
    9th European Conference on Applications of Surface and Interface Analysis (ECASIA '01) (Avignon, France, Sep. 30-Oct. 5, 2001) pp.198-198.
  • "Atomic Level Characterization of Sc-O/W(100) Emitter at High Temperatures"
    S. Iida, T. Tsujita, T. Kawano, T. Nagatomi, Y. Kimura and Y. Takai
    9th European Conference on Applications of Surface and Interface Analysis (ECASIA '01) (Avignon, France, Sep. 30-Oct. 5, 2001) pp.199-199.
  • "Monte Carlo Modeling of X-ray Generation by Electron Impact"
    T. Nagatomi, Y. Kimura, Y. Takai, S. Awata, T. Yurugi and K. Obori
    9th European Conference on Applications of Surface and Interface Analysis (ECASIA '01) (Avignon, France, Sep. 30-Oct. 5, 2001) (Erratum).
  • "Monte Carlo Modeling of X-ray Generation under Electron Bombardment"
    T. Nagatomi, T. Shimada, Y. Kimura, Y. Takai, S. Awata, T. Yurugi and K. Obori
    3rd International Symposium on Atomic Level Characterization for New Material and Deveices '01 (ALC '01) (Nara, Japan, Nov. 11-14, 2001) pp37-37.
  • "Monte Carlo Simulation of X-ray Generation in W/Cu-target as applied to Optimum Designing of High Power X-ray Source"
    A. Yoshioka, K. Araki, R. Shimizu, T. Nagatomi and Z.-J. Ding
    3rd International Symposium on Atomic Level Characterization for New Material and Deveices '01 (ALC '01) (Nara, Japan, Nov. 11-14, 2001) pp38-38.
  • "Quantitative Measurements of Surface Potential and Amount of Charging in Insulator Sample under Electron Beam Irradiation"
    Y. Mizuhara, T. Nagatomi, Y. Kimura, Y. Takai and M. Inoue
    3rd International Symposium on Atomic Level Characterization for New Material and Deveices '01 (ALC '01) (Nara, Japan, Nov. 11-14, 2001) pp41-41.
  • "Construction of Database of Effective Energy Loss functions"
    T. Nagatomi, Y. Takai, B.V. Crist and R. Shimizu
    3rd International Symposium on Atomic Level Characterization for New Material and Deveices '01 (ALC '01) (Nara, Japan, Nov. 11-14, 2001) pp43-43.
  • "Phase Reconstruction with Aberration Correction by Three-Dimensional Fourier Filtering Method"
    T. Kawasaki and Y. Takai
    3rd International Symposium on Atomic Level Characterization for New Material and Deveices '01 (ALC '01) (Nara, Japan, Nov. 11-14, 2001) pp45-45.
  • "Atomic Level Characterization of Sc-O/W(100) Emitter at High Temperatures I"
    S. Iida, T. Tsujita, T. Nagatomi, Y. Kimura and Y. Takai
    3rd International Symposium on Atomic Level Characterization for New Material and Deveices '01 (ALC '01) (Nara, Japan, Nov. 11-14, 2001) pp55-55.
  • "Atomic Level Characterization of Sc-O/W(100) Emitter at High Temperatures II"
    T. Tsujita, S. Iida, T. Nagatomi, Y. Kimura and Y. Takai
    3rd International Symposium on Atomic Level Characterization for New Material and Deveices '01 (ALC '01) (Nara, Japan, Nov. 11-14, 2001) pp56-56.
  • "Study on Surface Structure of Zr-O/W(100) by X-ray Photoelectron Diffraction"
    M. Amano, K. Tamura, H. Ishii, M. Owari, T. Kawano, T. Nagatomi, Y. Takai, R. Shimizu and Y. Nihei
    3rd International Symposium on Atomic Level Characterization for New Material and Deveices '01 (ALC '01) (Nara, Japan, Nov. 11-14, 2001) pp57-57.

2000

  • "Real-time Defocus Image Modulation Processing Electron Microscope"
    Y. Takai, H. Utsuro, T. Kawasaki, Y. Kimura, T. Ikuta and R. Shimizu
    Proc. of 7th NIRIM International Symposium on Advanced Materials (ISAM 2000) (NIRIM, Japan, Feb. 29-March 3, 2000) pp.65-66 (invited).
  • "Phase Reconstruction of Crystalline Samples by Three-Dimensional Fourier Filtering Method"
    T. Kawasaki, Y. Takai, T. Ikuta and R. Shimizu
    Proc. of 7th Asia-Pacific Electron Microscopy Conference (7APEM) (Singapore, June 26-30, 2000) pp.126-127.
  • "Defocus Image Modulation Processing Electron Microscope: Dynamic Observation of Crystal Deformation"
    Y. Takai, H. Utsuro, T. Kawasaki, Y. Kimura, T. Ikuta and R. Shimizu
    Proc. of 7th Asia-Pacific Electron Microscopy Conference (7APEM) (Singapore, June 26-30, 2000) pp.128-129.
  • "TEM Study of Etch Hillocks and Etch Pits Formed in LiTaO3 Single Crystal"
    T. Ueda, Y. Takai, R. Shimizu, H. Yagyu, M. Souma and T. Matsushima
    Proc. of 7th Asia-Pacific Electron Microscopy Conference (7APEM) (Singapore, June 26-30, 2000) pp.237-238.
  • "Real-Time Defocus-Image Modulation Processing Electron Microscope: Recent Progresses on Spatial Resolution and Time Resolution"
    Y. Takai, Y. Kimura, T. Ikuta and R. Shimizu
    Proc. of 6th International Conference of The International Union of Materials Research Societies in Asia (China, July 23-26, 2000) pp.a5.5.
  • "Development of Monte Carlo Simulation of Characteristic And Continuum X-ray Generation by Electron Impact"
    T. Nagatomi, K. Fujii, Y. Kimura, Y. Takai, R. Shimizu, T. Yurugi and K. Obori
    The Second Meeting of the International Union of Microbeam Analysis Societies (IUMAS 2000) (Kailua-Kona, Hawaii, July 9-14, 2000) pp.289-290.
  • "Surface Analysis at High Temperatures as Applied to Sc-O/W(100) System"
    T.Kawano, Y.Takai and R.Shimizu
    The Second Meeting of the International Union of Microbeam Analysis Societies (IUMAS 2000) (Kailua-Kona, Hawaii, July 9-14, 2000) pp.319-320.
  • "A Novel CCD Video Camera with Operation-Function Incorporated"
    K. Nishikata, Y. Kimura, Y. Takai, R. Shimizu and T. Ikuta
    The Second Meeting of the International Union of Microbeam Analysis Societies (IUMAS 2000) (Kailua-Kona, Hawaii, July 9-14, 2000) pp.477-478.
  • "A Floating Type Compact Low Energy Ion Gun for nm-Etching"
    T. Matsutani, Y.W. Beag, Y. Takai, R. Shimizu, R. Aihara and Y. Sakuma
    The Second Meeting of the International Union of Microbeam Analysis Societies (IUMAS 2000) (Kailua-Kona, Hawaii, July 9-14, 2000) pp.483-484.
  • "A Floating Type Compact Low Energy Ion Gun for Shallow Dopant Depth-Profiling"
    T. Matsutani, K. Iwamono, T. Nagatomi, Y. Kimura, Y. Takai, R. Shimizu, R. Aihara and Y. Sakuma
    Proc. of The Second International Symposium on SIMS and Related Techniques (Seikei University, Tokyo, Japan, Nov. 8-9, 2000) pp.7-9.
  • "Real-Time Correction of Spherical Aberration by Defocus-Image Modulation Processing"
    Y. Takai, K. Nishikata, Y. Kimura, T. Ikuta and R. Shimizu
    Proc. of 8th Conference on Frontiers of Electron Microscopy in Material Science (Matsue, Japan, Nov. 13-17, 2000) pp.55-57 (invited).
  • "Construction of Local Area Electron Diffraction Pattern Using Through-Focus Images"
    T. Kawasaki, Y. Takai, T. Ikuta and R. Shimizu
    Proc. of 8th Conference on Frontiers of Electron Microscopy in Material Science (Matsue, Japan, Nov. 13-17, 2000) pp.100-100.
  • "New Hydroxyapatite Coating Method for Biocompatible Material"
    T. Nakayama, M. Kuwata and T. Matsutani Proc. of The Second Asian Pacific Laser Symposium (Shanghai, China, Aug. 2000) (in press).

1999

  • "Surface Effects in Energy Loss Processes"
    T.Nagatomi
    International Workshop on "XPS: From Physics to Data",(Hortobagy, Hungary, April 26-30, 1999) (invited).
  • "9th International Conference on Production Engineering, Precision Science and Technologyfor Perfect Surface"
    Y.Harada, M.Niwa, T.Nagatomi and R.Shimizu
    (Osaka, Japan, August 30- September 1, 1999).
  • "Transmission Electron Microscopic Study of Heteroepitaxial Mechanism of CVD-Diamond Grown on Pt(111) Substrate"
    G.F.Zhou, Y.Takai and R.Shimizu
    Proc. of Microscopy and Microanalysis '99, supplement 2, 170-171.
  • "Surface modification of biomaterials by laser irradiation method"
    K. Kumazaki, M. Kuwata, T. Matsutani and T. Nakayama
    Tech. Digest of CLEO/Pacific Rim '99 Vol.4, (Seoul, Korea, May 1999) 1301.
  • "Deposition of silicon carbide Films using ECR plasma of methylsilane"
    T. Matsutani, M. Kiuchi, T. Takeuchi, T. Matsumoto, K. Mimoto and S. Goto
    Proceedings of ISAPS '99, Advances in Applied plasma science Vol. 2 (Osaka, Japan, Sep 1999) 147.

1998

  • "Development of Real-Time Defocus Image Modulation Processing Electron Microscope:Construction and Applications"
    Y.Takai,H.Utsuro, T.Ando, Y.Kimura, T.Ikuta, R.Shimizu, Y.Sato, S.Isakozawa and M.Ichihashi
    Proc. of 14th Int. Conf. on Electron Microscopy (in Cancun, Mexico), 1 (1998) 115-118.
  • "Super-resolved wavefield restoration by defocus image modulation processing under hollow-cone illumination"
    H.Utsuro, T.Ando, Y.Kimura, Y.Takai, T.Ikuta, R.Shimizu
    Proc. of 14th Int. Conf. on Electron Microscopy (in Cancun, Mexico), 1 (1998) 179-180.
  • "Reconstructionof Spherical Aberration-Free Imagesby Three-Dimensional Filtering"
    T.Kawasaki, H.Utsuro, Y.Takai, T.Ikuta and R.Shimizu
    Proc. of 14th Int. Conf. on Electron Microscopy (in Cancun, Mexico), 1 (1998) 151-152.
  • "TEM Observation of Nucleation Site of Diamond Particles Heteroepitaxially Grown on Pt(111) Substrate"
    G.F.Zhou, Y.Takai and R.Shimizu
    Proc. of 14th Int. Conf. on Electron Microscopy (in Cancun, Mexico), 2 (1998) 363-364.
  • "Real-time Observation of Spherical Aberration-Free Phase Image by Defocus-Image Modulation Processing Electron Microscope"
    Y.Takai, H.Utsuro, T.Kawasaki, Y.Kimura, T.Ikuta and R.Shimizu
    Proc. of Japan-China Joint Seminor on Atomic Level Characterization (Matsue, Japan), 1, (1998) 126-128.
  • "Interface structure analysis of CVD diamond particles heteroepitaxially grown on Pt(111) substrate by transmission electron microscope"
    G.F.Zhou, Y.Takai and R.Shimizu
    Proc. of Japan-China Joint Seminor on Atomic Level Characteriation (Matsue, Japan), 1 (1998) 126-128.
  • "Effective Energy Loss Functions and XPS Source Functions from Oxygen-adsorbed Silicon Surface"
    T.Nagatomi, Y.Harada, M.Niwa and R.Shimizu
    14th International Vacuum Congress (IVC-14), 10th International Conference on Solid Surfaces (ICSS-10), 5th International Conference on Nanometer-scale Science and Technology (NONO 5) & 10th International Conference on Quantitative Surface Analysis (QSA-10), (Birmingham, UK, August 31- September 4, 1998).
  • "Initial Stage of Oxidation of Si(001)-2(1 Surface Studied by X-ray Photoelectron Spectroscopy"
    Y.Harada, M.Niwa, T.Nagatomi and R.Shimizu
    1998 International Conference on Solid State Devices and Materials (SSDM '99),(Hiroshima, Japan, September 7-10, 1998).

1997

  • "Microstructure of transparent and electro-conductive Titanium Nitride Films"
    M.Kiuchi, A.Chayahara, M.Tarutani, Y.Takai and R.Shimizu
    The 4th IUMRS International Conf. in Asia, Abstract(1997).
  • "Development of Real-Time Defocus Image Modulation Processing Electron Microscope"
    Y.Takai,H.Utsuro, Y.Kimura, T.Ikuta, R.Shimizu, Y.Sato, S.Isakozawa and M.Ichihashi
    Proc. of Int.Symp. on Atomic Level Characterization (ALC '97 in Maui), 1 (1997) 24-29.
  • "Energy Losses of Swift Protons to Hydrogen Atoms"
    K.Tokesi, R.H.Ritchie, T.Nagatomi and R.Shimizu
    Proceedings of the International Symposium on Atomic Level Characterizations for New Materials and Devices '97, (Maui, Hawaii, USA, 23-28 November, 1997) pp106.
  • "Energy Loss Functions for Electron Energy Loss Spectroscopy"
    T.Nagatomi, K.Tokesi, R.Shimizu and R.H.Ritchie
    Proceedings of the International Symposium on Atomic Level Characterizations for New Materials and Devices '97, (Maui, Hawaii, USA, 23-28 November, 1997) pp372.

1996

  • "Cross-sectional transmission electron microscope observation of a Chemical Vapor deposition diamond particle grown on a mirror polished Si substrate"
    M.Tarutani, Y.Takai and R.Shimizu
    14th Australian Conf. on Electron Micros., Abstruct (1996) (invited).
  • "Defocus-modulation image processing electron microscope- A possibility for aberration-free electron microscopy -"
    Y.Takai and R.Shimizu
    14th Australian Conf. on Electron Micros., Abstruct (1996) (invited).
  • "Accurate measurement of Information limit in TEM by three -dimensional power spectrum"
    Y.Takai
    6th Asia-Pacific Conference on Electron Microscopy (Hong Kong), 1 (1996) 75-76.
  • "Defocus image modulation processing electron microscope for spherical-aberration- free observation in real time"
    T.Ando, T.Ikuta, Y.Kimura, Y.Takai and R.Shimizu
    6th Asia-Pacific Conference on Electron Microscopy (Hong Kong), 1 (1996) 77-78 .

1995

  • "Characterization of Defect Structures of Homoepitaxial Diamond by Cross-sectional TEM"
    M.Tarutani, Y.Takai, R.Shimizu, T.Ando, M.Kamo and Y.Bando
    2nd NIHIM International Symposium on Advanced Material (Tukuba), 1 (1995, Mar) 261-266.
  • "Principles of spherical aberration correction by defocus-modulation image processing"
    Y.Takai
    BCEIA '95, 1 (1995) 115-116.
  • "Surface Loss Function for kV Electrons In Native Oxides on Si"
    T.Nagatomi, R.Shimizu, Z.-J.Ding, H.Fujii and E.Kusumoto
    13th International Vacuum Congress (IVC-13) & 9th International Conference on Silid Surfaces (ICSS-9), (Yokohama, Japan, September 25-29, 1995).

1994

  • "Spherical aberration-free imaging by hollow-cone illumination processed by the focal-depth extension method"
    Y.Takai, N.Oba, T.Ando, T.Ikuta and R.Shimizu
    International Conference on Electron Microscopy (ICEM13, in Paris), 1 (1994) 153-154.
  • "Development of real-time defocus modulation image processing system for spherical-aberration- free TEM observation"
    T.Ando, T.Ikuta, Y.Takai and R.Shimizu
    International Conference on Electron Microscopy (ICEM13, in Paris), 1 (1994) 191-192.
  • "Absolute thickness measurement of native oxide film bycross-sectinal TEM observation"
    Y.Takai, Z.D.Zheng, M.Tarutani and R.Simizu
    1st Japan-China Joint Symposium on Microbeam Analysis, (Guangzhou), 1 (1994) 253-257.
  • "Simultanious correction of sphercial and chromatic aberration by focal depth extension processing"
    Y.Takai
    Satelite Sympo of 4th Int. Conf. on Charged Particle Optics, (Tsukuba), 1 (1994) 9-10.
  • "Cross-sectional TEM observation of Homoepitaxial Diamond"
    M.Tarutani, T.Ando, M.Kamo, Y.Takai and R.Shimizu
    4th International Conference on New Diamond Science and Technology (Kobe), 1 (1994) 247-250.
  • "Coincidence Measurement of Characteristic X-ray Photon and Transmitted Electron for Coincidence Electron Microscopy"
    M.Yasuno, Y.Kimura and R.Shimizu
    Proceedings of the 13th International Congress on Electron Microscopy, vol.1, (1994, july) 257-258.

1993

  • "Spherical aberration-free observation of reconstructed Au(011)2x1 surface by HRTEM using defocus-modulation image processing"
    Y.Takai, Y.Taniguchi, T.Ikuta and R.Shimizu
    Proc. of MSA. (1993) 970-971.
  • "A novel UHV- REM as applied to observation of reconstruction of Pt(100)surface"
    M.Takeguchi, T Akita, Y Takai, K.Shibata and R.Shimizu
    Proc. of MSA, (1993) 1132-1133 .
  • "Retrieval of structural information from HRTEM images by defocus-modulationimage processing"
    Y.Takai, Y.Taniguchi, T.Ikuta and R.Shimizu
    Proc. of the 7th Chinese-Japanese Electron Microscopy Seminar Science Press 1 (1993) 93-98.
  • "Simulation of HRTEM Images of Au(011) surface steps"
    Z.D.Zheng, Y.Takai and R.Shimizu
    Proc. 7th Chinese-Japanese Seminor on Electron Microscopy, Science Press 1 (1993) 99-100.

1992

  • "Structure and migration of planar defects observed in atomic scale"
    H.Hashimoto, Y.Sugimoto, Y.Takai and H.Endoh
    Proc. 9th Int. Cong Electron Micros., Tronto, 1 (1978), p284-285.
  • "Fine structure of the images of atoms in crystals and in situ observation of atom movement in crystals"
    H.Hashimoto, Y.Takai, Y.Yokota, A.Kumao, H.Endoh, E.Fukada and H.Tomioka
    Proc. EMSA 37th Meet., San Antonio, (1979) p384-387.
  • "Dynamic and simultaneous observation of electron microscopic images and diffraction patterns of crystal lattice structure"
    H.Hashimoto, Y.Yokota, Y.Takai, M.Tomita, T.Kori, M.Fujino and H.Endoh
    Proc. 7th European Cong. on Elec. Micros., Hague, 1 (1980) p118-119.
  • "Stacking fault tetrahedra introduced in gold by 2MeV electrons and their behavioursunder 100kV electron illumination"
    H.Hashimoto, Y.Takai, N.Ajika and H.Endoh
    Proc. Int. Conf. HUEM, Antwerp, 4 (1980) p240-243.
  • "Improvement of resolution for the crystal structure image and dynamic observation of movement of atoms in crystals and atom clusters"
    H.Hashimoto, H.Endoh, Y.Takai, Y.Yokota and A.Kumao Inst.
    Phys. Conf. Ser., 52 (1980) p3-8.
  • "Petal and horseshoe shape contrasts of the electron microscopic images of atoms in 011 gold crystal in deviated Bragg condition"
    Y.Takai, H.Hashimoto, H.Endoh and N.Ajika
    Inst. Phys. Conf. Ser., Cambridge, 61 (1981) p361-354.
  • "Image contrast of single vacancies and small stacking fault tetrahedra in gold crystals studied by an atom resolution electron microscope"
    Y.Takai, N.Ajika and H.Hashimoto
    Proc. 5th Yamada Conf. on Point Defects, Kyoto, 1 (1981) p702-704.
  • "Detection of point defects and dynamic observation of defect interaction by atom resolution microscopy"
    H.Hashimoto, Y.Takai, N.Ajika, Y.Yokota and H.Endoh
    Proc. 5th Yamada Conf. on Point Defects, 1 (1981) p698-701.
  • "High resolution electron microscope observations of small point defect clucters and their thermal stability"
    Y.Shimomura, K.Kitagawa, Y.Takai and H.Hashimoto
    Proc. 5th Yamada Conf. on Point Defects, Kyoto, 1 (1981) p708-711.
  • "Atom resolution electron microscope images of silicon containing antimony"
    Y.Takai, N.D.Zakharov and H.Hashimoto
    Proc. 10th Int. Cong. on Electron Micros., Hamburg, 2 (1982) p375-376.
  • "Detection of defects and impurities of atomic level by atom resolution electron microscopy and energy selecting microscopy"
    H.Hashimoto, F.P.Ottensmeyer, Y.Takai, N.Ajika and H.Endoh
    Proc. 10th Cong. on Electron Micros., Hamburg, 2 (1982) p65-66.
  • "Crystal structure of Cu4O formed by oxidation of copper"
    R.Guan, T.Yoshida, H.Hashimoto, Y.Takai and H.Endoh
    Proc. 10th Int. Cong. on Electron Micros., Hamburg, 2 (1982) p13-14.
  • "Direct TEM observations of atoms and on-line image analysis"
    H.Hashimoto, Y.Takai, N.Ajika and M.Tomita
    Proc. 15th annual Conf. of EMSI, 1 (1983) p9-18.
  • "Structure image of thick MgO crystal taken at 80kV - 1MeV"
    H.Hashimoto, H.Endoh, Y.Takai, N.Ajika, M.Tomita, M.Kuwabara and K.Hiraga
    Conf. on High Voltage Electron Microscopy, Berkeley, (1983), p41-46.
  • "HREM observation of metastable ordered phases in Ni3Mo alloy"
    M.Yamamoto, S.Nenno, M.Goto, K.Shiraki, Y.Takai and H.Hashimoto
    Proc. XIth Int. Cong. on Electron Microscopy, Kyoto, (1986) p1215-1216.
  • "High resolution electron microscopy of dynamic event revealed by TVand image processing"
    H.Hashimoto, Y.Yokota and Y.Takai
    Institute Physics Conference Series (Proc. EMAG-MICRO 89, London), 98 (1989) p339-344.
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