原著論文 - 研究業績

2014

  • "Stimulated Raman Spectral Microscope using Synchronized Er- and Yb-fiber lasers"
    K. Nose, T. Kishi, Y. Ozeki, Y. Kanematsu, H. Tanaka, K. Fukui, Y. Takai and K. Itoh
    Jpn. J. Appl. Phys. 53, No. 5, 052401 (2014).
  • "RF Spectral Modulation Caused by Delayed Interface and Photodetection of Optical Noise"
    K. Nose, Y. Ozeki, Y. Kanematsu, Y. Takai and K. Itoh
    Optical Review 21, No. 4, 425-428 (2014).

2013

  • "Cross-sectional transmission electron microscopy observation of sub-nano-sized molybdenum carbide crystals in carbon nanotubes"
    R. Sagawa, K.Kurushima, Y.Otsuka and Y. Takai
    Microscopy 62, 405-410 (2013).
  • "A new type of molybdenum oxide crystal encapsulated inside a single-walled carbon nanotube"
    R. Sagawa, W. Togashi, T. Akita, and Y. Takai
    Microscopy 62, 271-282 (2013).
  • "Structure of prismatic halloysite"
    T. Kogure, K. Mori, V.A. Drits, and Y. Takai
    American Mineralogist 98, 1008-1016 (2013).

2012

  • "Changes in Ionization Potentials of MgO and CaO Films upon Heating in Air and Vacuum Investigated by Metastable De-excitation Spectroscopy"
    K. Yoshino, Y. Morita, T. Nagatomi, M. Terauchi, T. Tsujita, Y. Doi, T. Nakayama, Y. Yamauchi, M. Nishitani, M. Kitagawa, Y. Yamauchi, and Y. Takai
    Appl. Surf. Sci. 259, 135-141 (2012).
  • "Molybdenum Oxide Crystals Encapsulated inside Carbon Nanotubes by Heat Treatment in Air"
    R. Sagawa, W. Togashi, T. Akita, and Y. Takai
    Surf. Interface Anal. 44, 797-800 (2012).
  • "Catalysis of nickel ferrite for photocatalytic water oxidation using [Ru(bpy)3]2+ and [S2O8]2-"
    D. Hong, Y. Yamada, T. Nagatomi, Y. Takai, S. Fukuzumi
    Journal of the American Chemical Society 134, issue 48, 19572-19575 (2012).

2011

  • "Unraveling the stacking structure in tubular halloysite using a new TEM with computer-assisted minimal-dose system"
    T. Kogure, K. Mori, Y. Kimura, and Y. Takai
    American Mineralogist 96, 1776-1780 (2011).
  • "Approach to Quantitative Evaluation of Electron-Induced Degradation of SiO2 Film Surface with Different Amounts of Carbon Contaminations"
    T. Nagatomi, H. Nakamura, Y. Takai, and S. Tanuma
    e-J. Surf. Sci. Nanotech. 9, 277-288 (2011).
  • "Ultra High Depth Resolution Auger Depth Profiling by Both Electron and Ion Beams at the Glancing Incidence using an Inclined Specimen Holder"
    T. Ogiwara, T. Nagatomi, K. J. Kim, and S. Tanuma
    J. Surf. Sci. Soc. Jpn. 32, No. 10, 664-669 (2011). (in Japanese)
  • "Investigation of Measurement Conditions of Metastable De-excitation Spectroscopy of MgO Thin Films Used for Plasma Display Panels"
    K. Yoshino, Y. Morita, T. Nagatomi, M. Terauchi, T. Tsujita, T. Nakayama, Y. Yamauchi, M. Nishitani, M. Kitagawa, Y. Yamauchi, and Y. Takai
    J. Surf. Anal. 18, No. 1, 13-25 (2011).
  • "Effects of Carbon Contaminations on Electron-Induced Damage of SiO2 Film Surface at Different Electron Primary Energies"
    T. Nagatomi, H. Nakamura, Y. Takai, T. Ogiwara, T. Kimura, and S. Tanuma
    J. Surf. Anal. 18, No. 1, 26-35 (2011).
  • "In-situ Crystal Structure Analysis of Cobalt Nanocompounds Synthesizing Graphite at High Temperatures"
    T. Yahiro and Y. Takai
    Jpn. J. Appl. Phys. 50, No. 1, 015103-1/6 (2011).
  • "Improvement in Discharge Delay Time by Accumulating Positive Wall Charges on Cathode MgO Protective Layer Surface in Alternating-Current Plasma Display Panels"
    K. Yoshino, T. Nagatomi, Y. Morita, T. Oue, N. Kosugi, M. Nishitani, M. Kitagawa, and Y. Takai
    Jpn. J. Appl. Phys. 50, No. 2, 026201-1/10 (2011).

2010

  • "Surface Energy Loss Processes in XPS Studied by Absolute Reflection Electron Energy Loss Spectroscopy"
    T. Nagatomi and K. Goto
    J. Electron Spectrosc. Relat. Phenom. 178-179, 178-185 (2010).
  • "In Situ Observation of Change in Surface Atomic Arrangement of Sc-O/W(100) System during Phase Transition at High Temperature"
    T. Nagatomi, Y. Nakanishi, and Y. Takai
    J. Vac. Sci. Technol. A 28, No.2, 199-206 (2010).
  • "Effects of Wall Charge on Firing Voltage and Statistical Delay Time in Alternating Current Plasma Display Panels"
    K. Yoshino, T. Nagatomi, Y. Morita, T. Oue, N. Kosugi, M. Nishitani, M. Kitagawa, and Y. Takai
    Jpn. J. Appl. Phys. 49, No. 4, 040212-1/3 (2010).
  • "Accumulation and Decay Characteristics of Exoelectron Sources at MgO Protective Layer Surface in Alternating-Current Plasma Display Panels"
    K. Yoshino, T. Nagatomi, Y. Morita, T. Oue, N. Kosugi, M. Nishitani, M. Kitagawa, and Y. Takai
    Jpn. J. Appl. Phys. 49, No. 8, 086205-1/5 (2010).
  • "Absolutely Determined Inelastic Mean Free Paths for 300-3000 eV Electrons in 10 Elemental Solids"
    T. Nagatomi, S. Tanuma, and K. Goto
    Surf. Interface Anal. 42, No. 10-11, 1537-1540 (2010).
  • "Working Group Report of Database Construction of Secondary Electron Yield (JSPS141-WG-SEY) [I] Precise Measurement by Charge Amplification Method"
    T. Nagatomi, K. Goto, R. Shimizu, and Members of JSPS141-WG-SEY
    Surf. Interface Anal. 42, No. 10-11, 1541-1543 (2010).

2009

  • "Change in Work Function during Phase Transition of Sc-O/W(100) System at High Temperatures"
    Y. Nakanishi, T. Nagatomi, and Y. Takai
    Appl. Surf. Sci. 256, No.4, 1082-1087 (2009).
  • "Inelastic Mean Free Path, Surface Excitation Parameter, and Differential Surface Excitation Parameter in Au for 300 to 3000 eV Electrons"
    T. Nagatomi and K. Goto
    Appl. Surf. Sci. 256, No.4, 1200-1204 (2009).
  • "In Situ Measurement of Surface Potential Developed on MgO Thin Film Surface under Ion Irradiation using Ion Scattering Spectroscopy"
    T. Nagatomi, T. Kuwayama, K. Yoshino, Y. Takai, Y. Morita, M. Nishitani, and M. Kitagawa
    J. Appl. Phys. 106, No.10, 104912-1/11 (2009).
  • "Influences of Measurement Conditions on Etching Rate of GaAs/AlAs Superlattice in Auger Electron Spectroscopy Sputter Depth Profiling"
    T. Nagatomi, T. Bungo, and Y. Takai
    J. Surf. Anal. 15, No.3, 329-332 (2009).
  • "Incident Angle and Energy Dependences of Low-Energy Ar+ Ion Sputtering of GaAs/AlAs Multilayered System"
    T. Nagatomi, T. Bungo, and Y. Takai
    Surf. Interface Anal. 41, No.7, 581-589 (2009).

2008

  • "Application of Ion Scattering Spectroscopy to Measurement of Surface Potential of MgO Thin Film under Ion Irradiation"
    T. Nagatomi, T. Kuwayama, Y. Takai, K. Yoshino, Y. Morita, M. Kitagawa, and M. Nishitani
    Appl. Phys. Lett. 92, No.8, 084104-1-3 (2008).
  • "Inelastic Interaction of Medium-Energy Electrons with Ni Surface Studied by Absolute Reflection Electron Energy Loss Spectrum Analysis and Monte Carlo Simulation"
    T. Nagatomi and K. Goto
    J. Surf. Anal. 15, No.2, 150-158 (2008).
  • "Wave Field Restoration Using Focal-Depth Extension Techniques under Dynamic Hollow-Cone Illumination"
    M. Taya, T. Ikuta and Y. Takai
    Optik 119, No.4, 153-160 (2008).
  • "Application of Experimentally Determined Inelastic Mean Free Path and Surface Excitation Parameter in Ni to Monte Carlo Simulation of Reflection Electron Energy Loss Spectrum"
    T. Nagatomi and K. Goto
    Surf. Interface Anal. 40, No.13, 1755-1759 (2008).
  • "Auger Spectral Shape Analysis of Sc-O/W(100) System during Phase Transition at High Temperature"
    Y. Nakanishi, T. Nagatomi and Y. Takai
    Surf. Interface Anal. 40, No.13, 1768-1771 (2008).
  • "Measurement of Precision for Developing Automatic Transmission Electron Microscope"
    M. Hayashida, Y. Kimura, Y. Takai
    Surf. Interface Anal. 40, No.13, 1777-1780 (2008).
  • "Kinetics of Surface Atoms during Phase Transition of Sc-O/W(100) System at High Temperature Studied by Auger Electron Spectroscopy"
    Y. Nakanishi, T. Nagatomi, and Y. Takai
    Surf. Sci. 602, No.24, 3696-3705 (2008).

2007

  • "Development of Annular Pupil for Scanning Transmission Electron Microscope by Focused Ion Beam Technique"
    T. Matsutani, M. Taya, T. Ikuta, T. Fujimura, H. Inui, T. Tanaka, Y. Kimura, Y. Takai, T. Kawasaki, and M. Ichihashi
    Advances in Applied Plasma Science 6, 209-212 (2007).
  • "Development of Micro-aperture for Annular Pupil on Electron Optics by Focused Ion Beam Technique"
    M. Fujiwara, T. Tanaka, I. Shimizu, T. Matsutani, M. Hisaki, T. Yasue, T. Ikuta, M. Taya, Y. Kimura, Y. Takai, T. Kawasak, and M. Ichihashi
    J. Vac. Soc. Jpn. 50, No.10, 639-643 (2007) (in Japanese).
  • "Development of Computer-Assisted Minimal-Dose System with Beam Blanker for TEM"
    M. Hayashida, T. Nomaguchi, Y. Kimura, and Y. Takai
    Micron 38, No.5, 505-512 (2007).
  • "Inelastic-Mean Free Paths And Surface Excitation Parameters by Absolute Reflection Electron-Energy Loss Measurements "
    T. Nagatomi and K. Goto
    Phys. Rev. B 75, No.23, 235424-1-12 (2007).
  • "Development of A Parallel Detection And Processing System Using A Multidetector Arrayfor Wave Field Restoration in Scanning Transmission Electron Microscopy"
    M. Taya, T. Matsutani, T. Ikuta, H. Saito, K. Ogai, Y. Harada, T. Tanaka, and Y. Takai
    Rev. Scientific Inatrum. 78, No.8, 083705-1-5 (2007).

2006

  • "Molecular-Scale Imaging of Unstained Deoxyribonucleic Acid Fibers by Phase Transmission Electron Microscopy"
    Y. Takai, T. Nomaguchi, S. Matsushita and Y. Kimura
    Appl. Phys. Lett. 89, No.13, 133903-1-133903-3 (2006).
  • "Estimation of Minimum Electron Dose Necessary to Resolve Molecular Structure of Deoxyribonucleic Acid by Phase Transmission Electron Microscopy"
    T. Nomaguchi, Y. Kimura, and Y. Takai
    Appl. Phys. Lett. 89, No.23, 231907-1-231907-3 (2006).
  • "Amplitude Contrast of A Single Gadolinium Atom Reconstructed by A Wave field Restoration Method"
    Y. Takai, T. Tsuji, H. Chikada and M. Taya
    Appl. Phys. Lett. 89, No.25, 253106-1-253106-3 (2006).
  • "Cross-Sectional Image Obtained from Spherical Aberration-Free Three-Dimensional Image Intensity Distribution in Transmission Electron Microscopy"
    M. Taya, T. Kawasaki, and Y. Takai
    J. Elec. Microsc. 55, No.1, 27-30 (2006).
  • "Study on Surface Excitations using Absolute Auger Electron Spectra"
    T. Nagatomi and K. Goto
    J. Surf. Anal. 13, No.3, 212-216 (2006) (in Japanese).
  • "Atomic Level Characterization Based on Defocus Modulation Electron Microscopy"
    Y. Takai, M. Taya, H. Chikada and Y. Kimura
    Microchimica Acta 155, No.1-2, 11-17 (2006).
  • "Estimation of Suitable Condition for Observing Copper-Phthalocyanine Crystalline Film by Transmission Electron Microscopy"
    M. Hayashida, T. Kawasaki, Y. Kimura and Y. Takai
    Nucl. Instr. and Meth. B 248, No.2, 273-278 (2006).
  • "Installation of Electronic-Field Type Electron Beam Blanker in High Resolution Transmission Electron Microscopy"
    M. Hayashida, Y. Kimura, Y. Taniguchi, M. Otsuka and Y. Takai
    Rev. Sci. Instrum. 77, No.11, 116114-1-116114-3 (2006).
  • "A Coincidence Transmission Electron Microscope with Digital Waveform Measuring System for Analytical Microscopy"
    K. Nishinaka, Y. Kimura and Y. Takai
    Surf. Interface Anal. 38, No.1, 19-24 (2006).
  • "Effects of Oxygen Atmosphere on Surface Properties of Sc-O/W(100) System as Schottky Emitter at High Temperature"
    Y. Nakanishi, T. Nagatomi and Y. Takai
    Surf. Interface Anal. 38, No.12-13, 1594-1597 (2006).
  • "Dependence of Depth Resolution on Primary Energy of Low-Energy Ar+ Ions (100-1000 eV) in AES Sputter Depth Profiling of GaAs/AlAs SUpterlattice"
    T. Bungo, T. Nagatomi and Y. Takai
    Surf. Interface Anal. 38, No.12-13, 1598-1603 (2006).
  • "Viologen-modified platinum clusters acting as an efficient catalyst in photocatalytic hydrogen evolution"
    H. Kotani, K. Ohkubo, Y. Takai and S. Fukuzumi
    Journal of Physical Chemistry B 110, issue 47, 24047-24053 (2006).

2005

  • "Absolute Determination of Inelastic Mean Free Paths and Surface Excitation Parameters by Absolute Reflection Electron Energy Loss Spectrum Analysis"
    T. Nagatomi and K. Goto
    Appl. Phys. Lett. 87, No.22, 224107-1-224107-3 (2005).
  • "Sputter Depth Profiling of Multiple Short-Period BN d-Doped Si by Work Function Measurement"
    Y. Mizuhara, T. Bungo, T. Nagatomi and Y. Takai
    Jpn. J. Appl. Phys. 44, No.8, 6289-6291 (2005).
  • "Change of Energy Distribution of He+ Induced Electrons from MgO Thin Film with Ion Irradiation"
    T. Tsujita, K. Nakayama, T. Nagatomi, Y. Takai, Y. Morita, M. Nishitani, M. Kitagawa and T. Uenoyama
    J. Surf. Anal. 12, No.3, 284-292 (2005).
  • "Self-Recovery Function of p(1x1)-Sc-O/W(100) system as Schottky Emitter"
    S. Iida, T. Nagatomi and Y. Takai
    Surf. Interface Anal. 37, No.2, 106-109 (2005).
  • "Abnormal Electron Emission from MgO Thin Film under Ion Irradiation"
    T. Tsujita, T. Nagatomi, and Y. Takai
    Surf. Interface Anal. 37, No.2, 137-140 (2005).
  • "Development of Ultrahigh Vacuum Floating-Type Low-Energy Ion Gun with Differential Pumping Facilities for High Resolution Depth Profiling"
    Y. Mizuhara, T. Bungo, T. Nagatomi, Y. Takai, S. Suzuki, K. Kikuchi, T. Sato and K. Uta
    Surf. Interface Anal. 37, No.2, 171-175 (2005).
  • "Surface Structure Analysis of Zr-O/W(100) at High Temperature by X-Ray Photoelectron Diffraction"
    K. Tamura, M. Amano, W. Chu, H. Ishii, M. Owari, T. Kawano, T. Nagatomi, Y. Takai, C. Oshima, R. Shimizu and Y. Nihei
    Surf. Interface Anal. 37, No.2, 217-220 (2005).
  • "Phase Transmission Electron Microscopy with Aberration Correction Based on Active Defocus Modulation: Dynamic Observation of Surface Atom Movement"
    Y. Takai, K. Nishikata, T. Kawasaki and Y. Kimura
    Surf. Interface Anal. 37, No.2, 248-251 (2005).
  • "Development of Digital Waveform Measurement System for Coincidence Transmission Electron Microscopy"
    K. Nishinaka, Y. Kimura and Y. Takai
    Surf. Interface Anal. 37, No.2, 252-255 (2005).
  • "Transmission Electron Microscopy Study of Low-Energy Ion Induced Damaged Layer"
    J. Kato, T. Nagatomi and Y. Takai
    Surf. Interface Anal. 37, No.2, 256-260 (2005).
  • "Preferential Sputtering Observed in Auger Electron Spectroscopy Sputter Depth Profiling of AlAs/GaAs Suppterlattice Using Low-Energy Ions"
    Y. Mizuhara, T. Bungo, T. Nagatomi and Y. Takai
    Surf. Interface Anal. 37, No.3, 343-347 (2005).
  • "Monte Carlo Modeling of Electron-Excited X-Ray Emission from Bulk Materials and Thin-Film/Substrate Systems"
    T. Nagatomi
    Surf. Interface Anal. 37, No.11, 887-894 (2005).
  • "Phase Transition on the Surface of Sc-O/W(100) Schottky Emitter"
    Y. Nakanishi, T. Nagatomi and Y. Takai
    Surf. Sci. 595, No.1-3, 97-106 (2005).
  • "Effective Phase Correction Function for High-Resolution Exit Wave Reconstruction by A Three-Dimensional Fourier Filtering Method"
    T. Kawasaki, M. Taya, T. Nomaguchi and Y. Takai
    Ultramicroscopy 102, No.2, 127-139 (2005).

2004

  • "Development of Coincidence Transmission Electron Microscope. III. Incorporation with γ-Type Imaging Energy Filter"
    K. Nishinaka, S. Taka, Y. Kimura and Y. Takai
    J. Electron Microsc. 53, No.3, 217-222 (2004).
  • "Practical Method to Determine the Filter Shape Function Used in the Three-Dimensional Fourier Filtering Method"
    T. Kawasaki, M. Taya and Y. Takai
    J. Electron Microsc. 53, No.3, 271-275 (2004).
  • "Separation of Linear And Non-Linear Imaging Components in High-Resolution Transmission Electron Microscope Images"
    T. Nomaguchi, T. Kawasaki, Y. Kimura and Y. Takai
    J. Electron Microsc. 53, No.4, 403-406 (2004).
  • "Monte Carlo Study of X-ray Generation from Film/Substrate Structure by Electron Impact"
    T. Hibi, T. Nagatomi, Y. Takai, K. Obori, S. Awata and T. Yurugi
    Jpn. J. Appl. Phys. 43, No.3, 1205-1206 (2004).
  • "Energy Distribution of Ion-Induced Secondary Electrons from MgO Surface"
    T. Tsujita, T. Nagatomi, Y. Takai, Y. Morita, M. Nishitani, M. Kitagawa and T. Uenoyama
    Jpn. J. Appl. Phys. 43, No.6B, L753-L755 (2004).
  • "Surface Structure of Sc-O/W(100) System used as Schottky Emitter at High Temperature"
    S. Iida, Y. Nakanishi, T. Nagatomi and Y. Takai
    Jpn. J. Appl. Phys. 43, No.9A, 6352-6353 (2004).

2003

  • "Transmission Electron Microscopy Study of Damaged Layer on GaAs Surface Induced by Low-Energy Ion Irradiation"
    J. Kato, T. Nagatomi and Y. Takai
    J. Appl. Phys. 94, No.11, 6372-6375 (2003).
  • "Quantitative analysis of surface atom positions in a thick crystal as determined by a reconstructed exit wave"
    T.Kawasaki, M.Taya and Y.Takai
    J. Electron Microsc. 52, No.4, 375-381 (2003).
  • "Analysis of Dopant Concentration in Semiconductor Using Secondary Electron Method"
    Y. Mizuhara, J. Kato, T. Nagatomi, Y. Takai and M. Inoue
    Jpn. J. Appl. Phys. 42, No.6B, L709-L711 (2003).
  • "Monte Carlo Modeling of Generation of Characteristic, Continuous and Fluorescent X-rays by Electron Impact"
    T. Nagatomi, T. Hibi, Y. Takai, K. Obori, S. Awata and T. Yurugi
    Jpn. J. Appl. Phys. 42, No.10, 6663-6671 (2003).
  • "Extension of MRI Model for Auger Electron Spectroscopy Sputter-Depth Profile Using Tilted Cylindrical Mirror Analyzer"
    T. Bungo, Y. Mizuhara, T. Nagatomi and Y. Takai
    Jpn. J. Appl. Phys. 42, No.12, 7580-7584 (2003).
  • "Novel Technique for Studying Secondary Electron Emission from MgO Surface as Protecting Insulator in Plasma Display Panel Cell"
    T. Nagatomi, Y. Mizuhara, T. Tsujita, and Y. Takai
    J. Vac. Soc. Jpn. 46, No.4, 352-355 (2003) (in Japanese).
  • "Real-Time Lock-In Imaging by A Newly Developed High-Speed Image-Processing Charge Coupled Device Video Camera"
    K. Nishikata, Y. Kimura, Y. Takai, T. Ikuta and R. Shimizu
    Rev. Sci. Instruments 74, No.3, 1393-1396 (2003).
  • "Low Energy Electron Diffraction Study of Surface Atomic Structure of Sc-O/W(100) Surface As Schottky Emitter at High Temperatures"
    S. Iida, T. Tsujita, T. Nagatomi and Y. Takai
    Surf. Interface Anal. 35, No.1, 7-10 (2003).
  • "Phase Reconstruction with Simultaneous Correction of Spherical and Astigmatic Aberrations by Three-Dimensional Fourier Filtering Method"
    T. Kawasaki and Y. Takai
    Surf. Interface Anal. 35, No.1, 51-54 (2003).
  • "Construction of Database of Effective Energy-Loss Functions"
    T. Nagatomi, Y. Takai, B.V. Crist, K. Goto and R. Shimizu
    Surf. Interface Anal. 35, No.2, 174-178 (2003).
  • "Real-Time Lock-In Energy Loss Imaging with A Novel High-Speed Image Processing CCD Video Camera"
    K. Nishikata, Y. Shimazaki, Y. Kimura, Y. Takai, T. Ikuta and H. Yumen
    Surf. Interface Anal. 35, No.2, 282-286 (2003).
  • "Novel Floating-Type Low-Energy Ion Gun for High-Resolution Depth Profiling in Ultrahigh Vacuum"
    Y. Mizuhara, J. Kato, T. Nagatomi, Y. Takai, T. Aoyama, A. Yoshimoto, M. Inoue and R. Shimizu
    Surf. Interface Anal. 35, No.3, 382-386 (2003).
  • "Surface Properties of Sc-O/W(100) System as Emitter at Room and High Temperatures"
    T. Nagatomi, S. Iida, T. Tsujita, and Y. Takai
    Surf. Sci. 523, No.1-2, L37-L40 (2003).
  • "Self-Recovery Function of Sc-O/W(100) System as Schottky Emitter"
    S. Iida, T. Tsujita, T. Nagatomi and Y. Takai
    Surf. Sci. 543, No.1-3, 1-4 (2003).
  • "Surface Atoms in Sc-O/W(100) System as Shottky Emitter at High Temperature"
    T. Tsujita, S. Iida, T. Nagatomi and Y. Takai
    Surf. Sci. 547, No.1-2, 99-107 (2003).

2002

  • "Atomic Level Characterization of Ultrathin Flat Cobalt Disilicide Film with Three Crystalline Domains"
    T. Ohtomo, T. Kawasaki and Y. Takai
    J. Appl. Phys. 91, No.12, 9663-9666 (2002).
  • "Quantitative Measurement of Surface Potential and Amount of Charging on Insulator Surface under Electron Beam Irradiation"
    Y. Mizuhara, J. Kato, T. Nagatomi, Y. Takai and M. Inoue
    J. Appl. Phys. 92, No.10, 6128-6133 (2002).
  • "Development of Unique Specimen Holder for LEED-AES Study of Sc-O/W(100) Surface as Schottky Emitter at High Temperatures"
    S. Iida, T. Tsujita, T. Nagatomi and Y. Takai
    J. Surf. Anal. 9, No.1, 81-87 (2002).
  • "Development of Ultra High Vacuum Transmission Electron Microscope for In Situ Observation of Silicides And Island Formation on Silicon Surface at High Temperatures by Reflection And Transmission Electron Microscope"
    J. Kato, Y. Higashi, T. Nagatomi and Y. Takai
    J. Surf. Anal. 9, No.2, 150-159 (2002).
  • "Development of Monte Carlo Simulation of Generation of Continuous and Characteristic X-rays by Electron Impact"
    K. Obori, S. Awata, T. Yurugi, K. Araki, T. Nagatomi, Y. Kimura and Y. Takai
    Jpn. J. Appl. Phys. 41, No.3A, 1616-1617 (2002).
  • "Monte Carlo Simulation of X-Ray Generation And Energy Dissipation in A W/Cu Target for Optimum Design of A High-Power X-Ray Source"
    K. Araki, A. Yoshioka, R. Shimizu, T. Nagatomi, S. Takahashi and Y. Nihei
    Surf. Interface Anal. 33, No.5, 376-380 (2002).
  • "Auger Electron Spectroscopy And Ion Scattering Spectroscopy Studies of Altered Layer Formation in AlN Thin Film Prepared by Post-Irradiation with N2+ Ions"
    Y. Mizuhara, R. Mitsuhashi, T. Nagatomi, Y. Takai and M. Inoue
    Surf. Interface Anal. 33, No.5, 437-440 (2002).

2001

  • "Distorted Surface And Interface Structures of Catalytic Gold Nanoparticles Observed by Spherical Aberration-Free Electron Microscopy"
    T. Kawasaki, Y. Takai and R. Shimizu
    Appl. Phys. Lett. 79, No.21, 3509-3511 (2001).
  • "Real-Time Observation of Spherical Aberration-Free Phase Images Using High-Speed Image Processing CCD Video Camera"
    K. Nishikata, T. Kawasaki, Y. Kimura, Y. Takai and R. Shimizu
    J. Elec. Microsc. 50, No.3, 271-273 (2001).
  • "Nano-Area Electron Diffraction Pattern Reconstructed From Three-Dimensional Fourier Spectrum"
    T. Kawasaki, Y. Takai, T. Ikuta and R. Shimizu
    J. Elec. Microsc. 50, No.5, 405-412 (2001).
  • "Fourier Analysis of HRTEM Image Deterioration Caused by Mechanical Vibration"
    T. Kawasaki, Y. Kimura, Y. Takai and R. Shimizu
    J. Elec. Microsc. 50, No.5, 413-416 (2001).
  • "Monte Carlo Simulation Study of Backscattered Electron Imaging in A Chemical Vapor Deposition Scanning Electron Microscope"
    T. Yoshida, K. Nishikata, T. Nagatomi, Y. Kimura and Y. Takai
    Jpn. J. Appl. Phys. 40, No.5A, 3457-3462 (2001).
  • "Flattening of Surface by Sputter-Etching with Low-Energy Ions"
    T. Matsutani, K. Iwamoto, T. Nagatomi, Y. Kimura and Y. Takai
    Jpn. J. Appl. Phys. 40, No.5A, L481-L483 (2001).
  • "Theoretical Background of Defocus Image Modulation Processing (DIMP) based on Three Dimensional Optical Transfer Functions (3D-OTFs)"
    H. Utsuro, T. Ando, Y. Takai, T. Ikuta and R. Shimizu
    Optik 112, No. 2, 67-75 (2001).
  • "Development of A Novel CCD Video Camera Incorporated with Operational Function for Real-Time Image Processing"
    K. Nishikata, Y. Kimura, Y. Takai, R. Shimizu, T. Ikuta, S. Fujimoto, H. Yumen and Y. Hashimoto
    Optik 112, No. 3, 97-98 (2001).
  • "Enrichment of Al in The Topmost Surface of AlN Crystalline Film Prepared by Post-Irradiation"
    Y. Mizuhara, R. Mitsuhashi, T. Nagatomi, Y. Takai, M. Inoue and R. Shimizu
    Surf. Interface Anal. 31, No. 2, 99-101 (2001).
  • "Dynamic Observation of An Atom Size Gold Wire by Phase Electron Microscope"
    Y. Takai, T. Kawasaki, Y. Kimura,T. Ikuta and R. Shimizu
    Phys. Rev. Lett. 87, No.3, 106105-1 - 106105-4 (2001).
  • "Wave Field Restoration Using Three-Dimensional Fourier Filtering Method"
    T. Kawasaki, Y. Takai, T. Ikuta and R. Shimizu
    Ultramicroscopy 90, No.1, 47-59 (2001).

2000

  • "A novel approach for Atomic Level Characterization by JSPS-Super electron Microscope"
    R.Shimizu, Y.Takai, Y.Kimura, H.Utsuro, T.Kawasaki, K.Nishikata, T.Ikuta and M.Ichihashi
    J. Korean Vac. Soc. 9, No.S2, 1-13 (2000).
  • "Initial Stage of Oxidation of Si(001)-2X1 Surface Studied by X-ray Photoelectron Spectroscopy"
    Y. Harada, M. Niwa, T. Nagatomi and R. Shimizu
    Jpn. J. Appl. Phys. 39, No.2A, 560-567 (2000).
  • "Characterization of Sc-O/W(100) Surface as Schottky Emitter: Work Function Change for Activation Processing"
    T. Kawano, Y. Takai and R. Shimizu
    Jpn. J. Appl. Phys. 39, No.2A, 577-580 (2000).
  • "Cross-Sectional Transmission Electron Microscopic Observation of Etch Hillocks and Etch Pits in LiTaO3 Single Crystal"
    T. Ueda, Y. Takai, R. Shimizu, H. Yagyu, M. Souma and T. Matsushima
    Jpn. J. Appl. Phys. 39, No.3A, 1200-1202 (2000).
  • "Study of Accumulation Effect of Bombarding N2+ Ions on Al Surface by Auger Electron Spectroscopy"
    R. Mitsuhashi, Y. Mizuhara, Y. W. Beag and R. Shimizu
    Jpn. J. Appl. Phys. 39, No.3A, 1329-1330 (2000).
  • "Continuum X-ray Generation from W Films on Cu Substrate"
    K. Obori, T. Yurugi, Z.-J. Ding, T. Nagatomi, K. Fujii, Y. Kimura and R. Shimizu
    Jpn. J. Appl. Phys. 39, No.3A, 1418-1425 (2000).
  • "Monte Carlo Simulation of Secondary Electron Emission from Tungsten Surfaces with Various Work Functions as Applied to Sc/W Surfaces"
    T. Kawano, Z.-J. Ding and R. Shimizu
    Jpn. J. Appl. Phys. 39, No. 4A, 1877-1879 (2000).
  • "Accumulation Effect of Bombarding N2+ Ions in Al for Crystal Growth of AlN Film"
    R. Mitsuhashi, Y.W. Beag and R. Shimizu
    Jpn. J. Appl. Phys. 39, No.5A, 2767-2770 (2000).
  • "Monte Carlo Simulation of Generations of Continuous and Characteristic X-rays by Electron Impact"
    K. Fujii, T. Nagatomi, Y. Kimura, Y. Takai, R. Shimizu, K. Obori and T. Yurugi
    Jpn. J. Appl. Phys. 39, No. 5A, 2863-2864 (2000).
  • "Imaging of Defect in IIa Diamond by Cathodoluminescence Field Emission Scanning Electron Microscope"
    S. Awata, H. Matsuo, Y. Kimura, Y. Takai and R. Shimizu
    J. Surf. Anal. 7, No.2, 234-237 (2000).
  • "Use of Low Energy Ions for Removal of Damaged Layer of Cross-sectioned Specimen Prepared by Focused Ion Beam"
    T. Matsutani, K. Iwamoto, T. Nagatomi, Y. Kimura, Y. Takai, R. Shimizu, R. Aihara and Y. Sakuma
    J. Surf. Anal. 7, No.3, 314-319 (2000).
  • "Floating-Type Compact Low-Energy Ion Gun -Basic Performance for High-Resolution Depth Profiling-"
    T. Matsutani, K. Iwamoto, T. Nagatomi, Y. Kimura, Y. Takai, R. Shimizu, R. Aihara and Y. Sakuma
    J. Vac. Soc. Jpn. 43, No.12, 1126-1128 (2000).
  • "Deposition of 3C-SiC Films Using ECR Plasma of Methylsilane"
    T. Matsutani, M. Kiuchi, T. Takeuchi, T. Matsumoto, K. Mimoto and S. Goto
    Vacuum 59, 152 (2000).

1999

  • "Energy Loss Functions for Electron Energy Loss Spectroscopy"
    T. Nagatomi, R. Shimizu and R.H. Ritchie
    Surf. Sci.419(1999)158-173.
  • "Effective Energy Loss Functions for Oxygen-Adsorbed Amorphous Silicon Surfaces"
    T.Nagatomi, R.Shimizu and R.H.Ritchie
    J. Appl. Phys. 85(1999)4231.
  • "Study on Zr-Si/W(100) Surface at High Temperatures by Reflection High Energy Electron Diffraction"
    Takashi Kawano, Riichiro Mitsuhashi, Yoshihide Kimura, Ryuichi Shimizu
    Jpn.J.Appl.Phys.,38 Part 1, No.5A (1999) 2951-2952.
  • "Evaluation of Image Drift Correction by Three-Dimensional Fourier Analysis"
    T.Kawasaki,H.Utsuro,Y.Takai and R.Shimizu
    J. Electron Micros.48(1999) 35-37.
  • "Nanoprobe Cathodoluminescence Scanning Electron Microscope as Applied to Synthesized Diamond"
    H. Matsuo, S. Awata, Y. Kimura and R. Shimizu
    J. Electron Micros.48No.5(1999) 569.
  • "Development of Real-Time Defocus Image Modulation Processing Electron Microscope: [I] Construction"
    Y.Kimura, Y.Takai, T.Kawasaki, R.Shimizu, T.Ikuta, S.Isakozawa, Y.Sato and M.Ichihashi
    J. Electron Microsc.,48 (1999) 873-876.
  • "Development of Real-Time Defocus Image Modulation Processing Electron Microscope: [II] Dynamic Observation of Spherical Aberration-free Phase Image of Surface Atom"
    Y.Takai, Y.Kimura, T.Ikuta, R.Shimizu, Y.Sato, S.Isakozawa, and M.Ichihashi
    J. Electron Microsc.,48 (1999) 879-885.
  • "Optimization of Voltage Axis Alignment in High-resolution Electron Microscopy"
    H. Utsuro, Y. Takai, T. Ikuta and R. Shimizu
    J. Electron Microsc.,48 (1999) 905-907.
  • "Oxygen Adsorption And Reaction on Alpha-Silicon"
    T.Nagatomi, Y.Harada, M.Niwa, Y.Takai and R.Shimizu
    Surf. Interface Anal.27 (1999) 776-782.
  • "Unique Source for Scandium Oxide Layer Deposition on Tungsten for Surface Study of High Electron Emissivity"
    T.Kawano, T.Saito, Y.Takai and R.Shimizu
    Surf. Interface Anal.,27 (1999) 981-983.
  • "AlN Film Growth under N2+ Ion Bombardment onto Al Surface"
    R. Mitsuhashi, Y.W. Beag, G. Zhou and R. Shimizu
    Ion Implantation Technology - 98. Eds. J. Matsuo, G. Takaoka and I. Yamada (IEEE. Inc. New Jersey, 1999) 1070.

1998

  • "Direct Observation of Dynamic Behaviour of Atomic Defects"
    H.Hashimoto, M.Kuwabara, Y.Takai, S.Tsubokawa and Y.Makita
    Radiation Effects and Defects in Solids,148, (1998) 161-179.
  • "The Microstructure of transparent and electrically conducting titanium nitride films"
    M.Kiuchi, A.Chayahara, M.Tarutani, Y.Takai and R.Shimizu
    Materials Chemistry and Physics 54(1998)330-333.
  • "Observation of Al surface during sputter-cleaning and annealing proceduresunder UHV-REM"
    T.Akita, T.Nagata, Y.Kimura, Y.Takai and R.Shimizu
    J. Electron Microsc. 47,No.3(1998)223-226.
  • "Influence of Native Oxides on the Reliability of Ultrathin Gate Oxide"
    M.Takeda, T.Oheaki, H.Fujii, E.Kusumoto, Y.Kaihara, Y.Takai and R.Shimizu
    Jpn. J. Appl. Phys. 37(1998)397-401.
  • "Cross-section Observation of Isolated Diamond Particles HeteroepitaxiallyGrown on Pt(111) Substrate"
    G.F.Zhou, Y.Takai and R.Shimizu
    Jpn. J. Appl. Phys. 37, No.6B(1998)L752-L754.
  • "Preliminary experiments for developing Real-Time Defocus Image Modulation Processing Electron Microscope: Equivalence between Objective Lens Current Modulation and Accelerating Voltage Modulation for Focus Control"
    Y.Takai, H.Utsuro,Y.Takai,T.Ikuta and R.Shimizu
    J. Electron Micros.47(1998)419-426.
  • "Evaluation of Image Drift Correction by Three-Dimensional Fourier Analysis"
    T.Kawasaki, H.Utsuro, Y.Takai and R.Shimizu
    J. Electron Micros.48(1998)35-37.
  • "Determination of Effective Energy Loss Functions And X-ray Photoelectron Spectroscopy Source Functions for Si 2p Photoelectrons from Clean Si(111), Oxygen-Adsorbed Si(111) And SiO2 Surfaces"
    T.Nagatomi, T.Kawano and R.Shimizu
    J. Appl. Phys. 83(1998)8016.
  • "New Energy Loss Functions for 1 keV Electrons Incident on Clean and Oxygen-Adsorbed Si(111) Surfaces"
    T.Nagatomi, T.Kawano, H.Fujii, E.Kusumoto and R.Shimizu
    Surf. Sci. 416(1998)184.
  • "Study on Zr-Si/W(100) Surface at High Temperatures by Combined Surface Analysis Techniques"
    Takashi Kawano, Yoshihide Kimura, Ryuichi Shimizu
    Jpn.J.Appl.Phys.,37,Part 1, No.8 (1998) 4561-4562.

1997

  • "Transmission Electron Microscope Study of HeteroepitaxialDiamond on Pt(111)"
    M.Tarutani, G.F.Zhou, Y.Takai, R.Shimizu, T.Tachibana, K.Kobashi and Y.Shintani
    Diamond and Related Materials 6(1997)272-276.
  • "A practical method for real-time active modulation electron microscopy -Optimization of driving-signal for active accelerating-voltage modulation"
    T.Ando, H.Utsuro, T.Ikuta, Y.Takai and R.Shimizu
    Optik 104(1997)163-165.
  • "Cross-sectional highresolution transmission electron microscope study of heteroepitaxial diamond film on Pt substrate"
    G.F.Zhou, M.Tarutani, Y.Takai and R.Shimizu
    Jpn. J. Appl. Phys. 36,No.4A(1997)2298-2302.
  • "Development of Accelerating-Voltage Modulation for Real-Time Defocus Image Modulation Processing Electron Microscope"
    T.Ando, H.Utsuro, Y.Kimura, T.Ikuta, Y.Takai and R.Shimizu
    Optik 106,No4(1997) 147-154.
  • "Diamond films heteroepitaxially grown on platinum (111)"
    T.Tachibana, Y.Yokota, K.Miyata, T.Onishi, K.Kobashi, M.Tarutani, Y.Takai and R.Shimizu
    Phys. Rev. B 56,No24(1997,Dec)15967-15981.
  • "Characterization of Silicon Native Oxide Formed in Wet Ozone Process"
    T.Ohwaki, M.Takeda and Y.Takai
    Jpn. J. Appl. Phys. 36,No.9A(1997)276-282.
  • "High-resolution Spherical-Aberration-Free Phase Imaging by Defocus Image Modulation Processing under Hollow-Cone Illumination: Experimental Confirmation by Optical Microscopy"
    H.Uturo, T.Ando, Y.Takai, R.Shimizu and T.Ikuta
    Optik 107,No.2(1997)67-72.
  • "Some Improvements for Coincidence Electron Microscope and Observation of Coincidence Image"
    M.Yasuno, Y.Kimura, R.Shimizu
    Optik106 No.1, (1997) p.p.19-27.
  • "Development of Coincidence Transmission Electron microscope [ II ] Observation of Coincidence Electron Microscopic Image"
    M.Yasuno, Y.Kimura and R.Shimizu
    Journal of Electron Microscopy,46 No.1, (1997) p.p.79-83.
  • "Principles and Applications of Defocus Image Modulation Processing Electron Microscope"
    Y.Takai, T.Ando, T.Ikuta and R.Shimizu
    Scanning Microscopy Supplement, 11 (1997) 389-404

1996

  • "Determination of New Energy Loss Functions as Applied to Analysis of Si 2p XPS Spectra"
    T.Nagatomi, Z.-J.Ding and R.Shimizu
    Surf. Sci. 359(1996)163.
  • "Defect structures of homoepitaxial diamond grown on various sites studied by transmission electron microscopy"
    M.Tarutani, Y.Takai and R.Shimizu
    Diamond Films and Technology 6, No.6(1996,Mar)365-377.
  • "Transmission electron microscopy study of interface and internal defect structures of homoepitaxial diamond"
    M.Tarutani, Y.Takai, R.Shimizu, T.Ando, M.Kamo, Y.Bando
    Appl. Phys. Lett. 68, No.15(1996)2070-2072.
  • "RHEED-ISS study on Zr-O/W(100) surface at high temperature"
    Y.Irokawa, R.Mitsuhashi, S.C.Lee, Y.Kimura, M.Inoue, Y.Takai and R.Shimiz
    Surface Science 367 (1996) 96-104.
  • "Surface Structure of Zr-O/W (100) System at 1700K"
    Y.Irokawa, R.Mitsuhashi, S. Lee, K. Y.Min, M.Inoue, Y.Kimura and R.Shimizu
    Jpn. J.Appl. Phys.35Part 1, No.7, (1996) p.p.4042-4043.
  • "Development of a Nanoprobe Cathodoluminescence Scanning Electron Microscope"
    H.Matsuo, N.Kobayashi, Y. Kimura and R.Shimizu
    J Electron Microsc.45 No.5, (1996) p.p.453-457.
  • "Transmission Electron Microscope: (1) Outline,Japan New Diamond Forum, (in Japanese)"
    M.Tarutani, Y.Takai, R.Shimizu
    12,No.3(1996,July)36-39.
  • "Transmission Electron Microscope: (2) Sample preparation, Japan New Diamond Forum, (in Japanese)"
    M.Tarutani, Y.Takai, R.Shimizu
    12, No.4 (1996) 36-40.

1995

  • "Extraction of spherical and chromatic aberration-free infomation by focal depth extension processing under tilted illumination"
    Y.Takai, N.Oba, T.Ando, T.Ikuta and R.Shimizu
    J. Electron Microsc. 44(1995)8-14.
  • "Cross-sectional TEM observation of isolated diamond particles grown on mirror polished Si substrate"
    M.Tarutani, Y.Shimato, Y.Takai and R.Shimizu
    Appl. Phys. Lett. 67(5)(1995)632-634.
  • "Nanofabrication of Grating and Dot Patterns by Electron HolographicLithography"
    K.Ogai, Y.Kimura, R.Shimizu, J.Fujita and S.Matsui
    Applied Physics Letters 66(1995)1560-1562.
  • "Development of Coincidence Transmission Microscope"
    Y.Kimura M.Yasuno and R.Shimizu
    J. Electron Microsc. 44No.5(1995) 295-300.
  • "Monte Carlo Simulation of Background in AES: A comparison with Experiment"
    Z.-J.Ding, T.Nagatomi, R.Shimizu and K.Goto
    Surf. Sci. 336(1995)397.
  • "Data Base for Surface Loss Function Derived by Extended Landau Formulation"
    T.Nagatomi, H.Yoshikawa, Z.-J.Ding and R.Shimizu
    Surf. Anal. 1 (1995) 157.

1994

  • "Spherical aberration-free observation of profile images of Au(011) surface by defocus- modulation image processing"
    Y.Takai, Y.Taniguchi, T.Ikuta and R.Shimizu
    Ultramicroscopy, 54, No.2-4(1994)250-260.
  • "Interface States in ZnO varistor with Mn, Co and Cu impurities"
    Y.Yano, Y.Takai and H.Morooka
    J.Mater.Res.,9, No.1 (Jan 1994)112-118.
  • "Development of real-time Defocus Modulation type Active Image Processing (DMAIP) for spherical-aberration-free TEM observation"
    T.Ando, Y.Taniguchi, Y.Takai, Y.Kimura, R.Shimizu and T.Ikuta
    Ultramicros., 54,No2-4, (1994)261-267.
  • "A practical method for modulation of accelerating voltage for active modulation image processing electron microscopy"
    Y.Kimura, Y.Taniguchi, T.Ando, Y.Takai, R.Shimizu and T.Ikuta
    Optik,95,No.4 (1994) 185-186.
  • "Development of real-time defocus-modulation-type active image processing (DMAIP) for spherical-aberration-free TEM observation"
    T.Ando, Y.Taniguchi, Y.Takai, Y.Kimura, R.Shimizu and T.Ikuta
    Ultramicroscopy 54 (1994) 261-267.
  • "Dynamic observation of a microelectric field in an oxide superconducting material by electron interference microscopy"
    K.Ogai, Y.Kimura and R.Shimizu
    Ultramicroscopy, 54 (1994) 345-350.
  • "Active Image Processing as Applied toHigh Resolution Electron Microscopy [II] Real-time Phase-plateless Electron Phase Microscopy by Accelerating-voltage Modulation"
    T.Ando, Y.Taniguchi, Y.Takai, Y.Kimura, R.Shimizu and T.Ikuta
    J. Electron Microsc, 43 (1994) 10-15.
  • "Angular Distribution of Sputtered Particles Ejected from Pure Cu, Pt and Cu-Pt alloy under 3 keV Ar+ Ion Bombardment"
    T.Nagatomi, K.Y.Min and R.Shimizu
    Jpn. J. Appl. Phys. 33 6675 (1994).
  • "A New Specimen Holder for UHV-Reflection Electron Microscopy"
    T. Akita, H. Matsuo, Y.Kimura and R.Shimizu
    J Electron Microsc. 43 No.5, (1994) p.p.332-336.
  • "Cross-Sectional TEM Observation of Homoepitaxial Diamond"
    M.Tarutani, T.Ando, M.Kamo, Y.Takai and R.Shimizu
    4th International Conference on New Diamond Science and Technology, (Kobe, Japan), 1 (1994) 247-250.
  • "Absolute Thickness Measurement of Native Oxide Film by Cross-Sectinal TEM Observation"
    Y.Takai, Z.D.Zheng, M.Tarutani and R.Simizu
    1st Japan-China Joint Symposium on Microbeam Analysis, (Guangzhou, China), 1 (1994) 253-257.
  • "Coincidence Measurement of Characteristic X-ray Photon and Transmitted Electron for Coincidence Electron Microscopy"
    M.Yasuno, Y.Kimura and R.Shimizu
    Proceedings of the 13th International Congress on Electron Microscopy, 1 (1994, july) 257-258.

1993

  • "Determination of Partially Coherent Parameters by lattice image contrast in TEM"
    Y.Takai, Y.Taniguchi and R.Shimizu
    J. Electron Microsc., 42(1993)7-13.
  • "4H-SiC/6H-SiC Interface Structures Studied by High-Resolution Transmission Electron Microscopy"
    H.Iwasaki, S.Inoue, T.Yoshinobu, M.Tarutani, Y.Takai, R.Shimizu
    A.Ito, T.Kimoto and H.Matsunami, Appl. Phys. Lett., 63 (1993) 2636-2637.
  • "Simulation of HRTEM Images of Au(011) Surface Steps"
    Z.D.Zheng, Y.Takai and R.Shimizu
    Proc. 7th Chinese-Japanese Seminor on Electron Microscopy, Science Press,1(1993)99-100
  • "A Novel UHV-REM as Applied to Observation of Reconstruction of Pt(100) surface"
    M.Takeguchi, T.Akita, Y.Takai, K. Shibata andR.Shimizu
    51st Annual Meeting of the Microscopy Society of America, Proceeding, (1993) p.p. 1132-1133.

1992

  • "Development of Zr-O/W(100) thermal field emission transmission electron microscope"
    M.Takeguchi, C.Hanqing, Y.Kimura, T.Ando and R.Shimizu
    Optik, Vol.92, No.2 (1992) 83-88.
  • "Correction of spherical aberration in HREM image using defocus-modulation imageprocessing"
    Y.Taniguchi, Y.Takai, T.Ikuta and R.Shimizu
    J.Electron Microsc., 41(1992)21-29.
  • "Spherical aberration free observation of TEM images by defocus-modulation image processing"
    Y.Taniguchi, Y.Takai, R.Shimizu, T.Ikuta, S.Isakozawa and T.Hashimoto
    Ultramicroscopy, 41(1992)323-333.
  • "A method for measuring film thickness by zone axis contrast of TEM image" Y.Takai
    J.Electron Microsc., 41(1992)116-119.
  • "SCF-Xα-SW calculations for small molecules using the optimization techinique of atomic sphere radii"
    Y.Takai and K.H.Johnson
    Chemi. Phys. Letters, 189(1992)518-523.
  • "Application pf the Focused-Ion-Beam Technique for Preparing the Cross-Sectional Sample of Chemical Vapor Deposition Diamond Thin Filmfor High-Resolution Transmission Electron Microscope Observation"
    M.Tarutani, Y.Takai and R.Shimizu
    Jpn.J.Appl.Phys, 31(1992)L1305-L1308.

1991

  • "Identification of atoms in crystals by the fine structure of their images"
    H.Hashimoto, H.Endoh, Y.Takai, H.Tomioka and Y.Yokota
    Chemica Scripta, 14 (1978-79), p23-31.
  • "Direct obserbation of dynamic behaviour of atoms in crystals and atom clusters by TEM."
    H.Hashimoto, Y.Yokota, Y.Takai, H.Endoh and A.Kumao
    Chemica Scripta, 14 (1978-79), p125-128.
  • "Direct observations of the arrangement of atoms around stacking faults and twins in gold crystals and the movement of atoms accompanying their formation and disappearance"
    H.Hashimoto, Y.Takai, Y.Yokota, H.Endoh and E.Fukada
    Jap. J. Appl. Phys, 19 (1980) L1-4.
  • "Electron-microscope images of the crystal lattice of gold containing plannar defects"
    Y.Takai, H.Hashimoto and H.Endoh
    Acta Cryst., A39 (1983) p516-523.
  • "New trend of atom resolution electron microscopy (Direct observations of atoms, vacancies and impurity atoms in crystal andon-line image analysis)"
    H.Endoh, H.Hashimoto and Y.Takai
    Trans. Jap. Inst. Metals, 24 (1983) p307-316.
  • "Electron microscope observation of the structure and behaviour of stacking fault tetrahedra and single vacancies in gold crystal irradiated by 2 MeV electrons"
    N.Ajika,H.Hashimoto and Y.Takai
    Phys. Stat. Sol.(a), 87 (1985) p235-252.
  • "Fine structure of the images of atoms 011-gold crystals in variousBragg reflecting conditions"
    H.Hashimoto and Y.Takai
    Journal of Microscopy, 142 (1986) p119-129.
  • "Electron microscope observations of lattice imperfections and their movement on atomic scale"
    H.Hashimoto,Y.Takai and Y.Yokota
    Acta Cryst., A44 (1988) p928-938.
  • "Computer simulation analysis of the planar channeling effect in practical ion implantation"
    Y.Kimura, Hee Jae Kang and R.Shimizu
    Jpn. J. Appl. Phys. 2, Lett., Vol.27, No.3, (1988) L444-7.
  • "Detection of small displacement of atoms in crystals by atom resolution electron microscopy"
    H.Hashimoto, M.Kuwabara, Y.Takai, S.Tsubokawa and Y.Yokota
    Journal of Electron Microscopy Technique, 12 (1989) p180-200.
  • "Optimization of atomic sphere radii in the Scattered-Wave Xα method : A second look at the water molecule "
    Y.Takai, M.M.Donovan, K.H.Johnson and G.Kalonji
    Chem. Phys. Letters, 159 (1989) p376-382.
  • "Preferentially oriented crystal growth in dynamic mixing process-an approach by Monte Carlo simulation"
    M.Kiuchi, A.Chayahara, Y.Horino, K.Fujii, M.Satou, Hee Jae Kang, Young Whoan Beag, Y.Kimura and R.Shimizu
    Jpn. J. Appl. Phys. 1, Vol.29, No.10 (1990) 2059-2065.
  • "Construction of RHEED-apparatus with high temperature sample holder"
    Y.W.Beag, Y.Kimura, R.Shimizu, M.Kiuchi and M.Satou
    Technol. Repts. Osaka Univ. Vol.41, No. 2053-2075 (1991) 273-276.
  • "Microfrabricated submicron Al-filament biprism as applied to electron holography"
    K.Ogai, Y.Kimura, R.Shimizu, K.shibashi, Y.Aoyagi and S.Namba
    Jpn. J. Appl. Phys. 1, Vol.30, No.11B (1991) 3272-3276.
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