解説・総説 - 研究業績

2012年

  • "表面電子分光法および深さ方向分析の標準化"
    鈴木峰晴,永富隆清,高橋和裕
    ぶんせき No. 7, 371-377 (2012).
  • "High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Holder based on Geometric Characteristics of Auger Electron Spectroscopy Apparatus Equipped with Concentric Hemispherical Analyzer"
    T. Ogiwara, T. Nagatomi, K. J. Kim and S. Tanuma
    J. Surf. Anal. 18, No. 3, 174-182 (2012) (in Japanese).

2011

  • "PSA10: 5th International Symposium on Practical Surface Analysis"
    K. J. Kim and T. Nagatomi
    J. Surf. Anal. 17, No. 3, 350-355 (2011).
  • "Photoemission Electron Spectroscopy V: Novel topics"
    J. D. Lee, T. Nagatomi, G. Mizutani, and K. Endo
    J. Surf. Anal. 18, No. 1, 36-57 (2011).
  • "第36回表面分析研究会でのWG活動の報告"
    T. Nagatomi
    J. Surf. Anal. 18, No. 1, 58-63 (2011).
  • "―表面分析実用化セミナー’11―「日常的な分析業務におけるJIS並びにISO規格の利用」の質疑応答集"
    T. Nagatomi
    J. Surf. Anal. 18, No. 2, 121-132 (2011).
  • "第37回表面分析研究会でのWG活動の報告"
    T. Nagatomi
    J. Surf. Anal. 18, No. 2, 133-133 (2011).

2010

  • "Surface Excitations in Surface Electron Spectroscopies Studied by Reflection Electron Energy Loss Spectroscopy and Elastic Peak Electron Spectroscopy"
    T. Nagatomi and S. Tanuma
    Analytical Sci. 26, No.2, 165-176 (2010).
  • "Photoemission Electron Spectroscopy III: Satellites by Extended Excitations"
    J. D. Lee, T. Nagatomi, G. Mizutani, and K. Endo
    J. Surf. Anal. 16, No.3, 196-213 (2010).
  • "Photoemission Electron Spectroscopy IV: Angle-resolved photoemission spectroscopy"
    J. D. Lee, T. Nagatomi, G. Mizutani, and K. Endo
    J. Surf. Anal. 17, No.2, 64-86 (2010).

2009

  • "Photoemission Electron Spectroscopy I: Histry and Overview"
    J. D. Lee, T. Nagatomi, G. Mizutani, and K. Endo
    J. Surf. Anal. 16, No.1, 42-63 (2009).
  • "iSAS-09開催記"
    吉川英樹,永富隆清,高橋和裕
    J. Surf. Anal. 16, No.1, 64-69 (2009).
  • "Photoemission Electron Spectroscopy II: Satellites by Local Excitations"
    J. D. Lee, T. Nagatomi, G. Mizutani, and K. Endo
    J. Surf. Anal. 16, No.2, 127-152 (2009).

2008

  • "深さ方向分析に関するアンケートのまとめ"
    永富隆清,高橋和裕,吉川英樹
    J. Surf. Anal. 15, No.1, 27-39 (2008).
  • "表面分析研究会主催国際ワークショップの開催に向けて"
    吉川英樹,永富隆清,高橋和裕
    J. Surf. Anal. 15, No.1, 89-90 (2008).

2006

  • "電子励起表面分析における弾性散乱ポテンシャルの役割"
    吉川英樹,永富隆清,木村昌弘
    表面科学 27, No.11, 628-635 (2006).

2005

  • "実時間焦点位置変調法による位相再構成と分解能向上"
    高井義造, 川崎忠寛, 木村吉秀, 生田孝
    日本結晶学会誌 47, 32-37 (2005).
  • "表面分析における固体中での電子輸送(先端追跡)"
    永富隆清
    表面科学 26, No.2, 49-49 (2005).
  • "表面化学分析におけるソフトウェアと標準化"
    永富隆清
    J. Surf. Anal. 12, No.3, 316-326 (2005).
  • "分析現場におけるEPMAの最近の動向に関するアンケート調査から"
    橋本哲,永富隆清,木村隆
    J. Surf. Anal. 12, No.4, 405-412 (2005).

2004

  • "3次元フーリエフィルタリング法による位相再構成"
    川崎忠寛, 木村吉秀, 高井義造, 生田孝
    顕微鏡 39, No. 1, 207-209 (2004).
  • "バックグラウンド解析法による表面電子励起効果の推定"
    永富隆清
    J. Surf. Anal. 11, No.2, 77-90 (2004).
  • "フラットパネルディスプレイ用電子放出材料の評価技術確立を目指して"
    永富隆清、辻田卓司、水原譲、飯田真一、高井義造
    月刊ディスプレイ No.10, 113-119 (2004).

2002

  • "透過型無収差位相差電子顕微鏡"
    高井義造
    応用物理 71, No.4, 408-414 (2002).
  • "高分解能電子顕微鏡用演算機能内蔵型CCDカメラ"
    西方健太郎、木村吉秀、高井義造、志水隆一、遊免秀二
    ケミカルエンジニヤリング 47, No.4, 44-52 (2002).
  • "3次元フーリエ・フィルタリング法による金微粒子の球面収差補正位相像"
    高井義造、川崎忠寛
    まてりあ 41, No.12, 886-887 (2002).

1999

  • "Reconstruction of ultra-high vacuum reflection electron microscope"
    S. Iida, S. Awata, T. Asahata, T. Nagatomi, Y. Kimura, Y. Takai and R. Shimizu
    Technol. Repts. Osaka Univ. 49 (1999) 99-104.
  • "Defocus-Image Modulation Processing as Applied to Observation of Unstained Biological Specimen"
    M.Sato, T.Ando, Y.Takai and R.Shimizu
    Technol. Repts. Osaka Univ. 49 (1999) 105-110.

1997

  • "Cross-sectional TEM Sample reparation by FIB"
    Y.Takai, M.Tarutani, R.Shimizu, H.Saka
    J. Electron Microsc. (in japanese) 32,No.1(1997)33-38.

1996

  • "Transmission Electron Microscope: (1)Outline,Japan New Diamond Forum,(in Japanese)"
    M.Tarutani, Y.Takai, R.Shimizu
    12,No.3(1996,July)36-39.
  • "Transmission Electron Microscope: (2)Sample preparation,Japan New Diamond Forum, (in japanese)"
    M.Tarutani, Y.Takai, R.Shimizu
    12,No.4(1996)36-40.
  • "Infrared Light Heating System for Precise Temperature Control of Specimen in Reflection Electron Microscope"
    T.Akita, T. Nagata, Y.Kimura and R.Shimizu
    Technol. Repts. of Osaka Univ.,46No.2247(1996)137-141

1995

  • "Cross Sectional TEM Observation of Homoepitaxial Diamond"
    M.Tarutani, Y.Takai, R.Shimizu, Y.Ando, M.Kamo
    Japan New Diamond Forum,(in japanese) 11,No.1(1995,Jan)21-25 .
  • "On the preparation of TEM specimens using focused ion beam"
    M.Tarutani, Y.Kaihara, Y.Takai, R.Shimizu
    J. Surface Sci. Soc. Japan., (in japanese) 16,No.12(1995)755-760 .
  • "Practical Improvement of MS-Xα molecular orbital calculation as applied to dissociation process of CO molcule"
    Y.Irokawa, M.Honjo, Y.Takai and R.Shimizu
    Technol. Repts. Osaka Univ., 45(1995)7-16.
  • "Coma-free alignment of TEM using through-tilt images"
    T.Nagata, T.Ando, Y.Takai and R.Shimizu
    Technol. Repts. of the Osaka Univ., 45(1995)107-115.
  • "Observation of profile images of surface atomic steps with spherical aberration correction"
    Y.Takai
    J. Electron Microsc.(in japanese),30,No.2(1995)197-200.

1994

  • "Development of Coincidence Transmission Electron Microscope (II) Time Correlation between Characteristic X-Rays and Transmitted Electrons"
    M.Yasuno, Y.Kimura and R.Shimizu
    Technol. Reps. Osaka Univ. Vol.44, no.2188 (1994) 229-234.
  • "New Parallel Observation System for LEED-AES with CCD Detector"
    N.Ebisu, Y.Kimura and R.Shimizu
    Technol. Reps. Osaka Univ. Vol.44, no.2187 (1994) 223-227.
  • "Developement of simulation code for electron microscope images by Howie-Whelan dynamical electron diffraction theory"
    Z.D.Zheng, Y.Takai and R.Shimizu
    Technological reports of Osaka University, 44, No.2165(Ap, 1994)21-27.
  • "Recent Developments in High Resolution Electron Microscopy,-Challenge to information limit of electron microscope -"
    Y.Takai
    J. Crystallographic Soc. Japan, (in japanese) 36,No.6 (1994)375-381 .

1993

  • "Construction of New LEED Optics for Intelligent LEED System"
    Y.Kimura, K.Nakashita, N.Ebisu, H.Yoshikawa, R.Shimizu and T.Noguchi
    Technol. Repts. Osaka Univ. Vol.43, no.2126 (1993) 17-24.
  • High energy-resolution Auger electron spectroscopy with retarding field cylindrical mirror analyzer"
    M.Souma, Li.Chung-Fei A.Kurokawa, Y.Kimura, R.Shimizu and Y.Sakai
    Technol. Repts. Osaka Univ.Vol.43,No.2142-2162 (1993) 181-186.
  • "Development of a Focused Ion Beam Apparatus for Preparing Cross-Sectional Transmission Electron Microscope Specimens"
    M.Tarutani, Y.Takai, R.Shimizu, K.Uda and H.Takahashi
    Technological Report of Osaka University , 43(1993)167-173.

1992

  • "The magnetic domains in Co Fine particles observed by Lorentz electron microscopy and electron holography"
    M.Tarutani, K.Harada, Y.Takai and R.Shimizu
    Technol. Repts. Osaka Univ., 31(1992)67-75.
  • "Development of coincidence transmission electron microscope. (I) Image construction by position sensitive multi-anode photomultiplier"
    Y.Kimura, A.Sugimoto, M.Yasuno and R.Shimizu
    Technol. Repts. Osaka Univ. Vol.42,No.2101-2123 (1992) 247-52.

1989

  • "Tripod type piezo-holder for scanning tunneling microscope"
    Y.Kimura, S.Tamoto and R.Shimizu
    Technol. Repts. Osaka Univ., Vol.39, No.1959-1985, (1989) 137-140.

1988

  • "Construction of a scanning tunneling microscope"
    Y.Kimura and R.Shimizu
    Technol. Repts. Osaka Univ., Vol.38,No.1930-1946, (1988) 223-228.

1983

  • "Observation of lattice imperfections and their motion in atomic scale"(in japanease)
    H.Hashimoto and Y.Takai
    Jap. J. of Metal, Vol.22, No.7(1983),p595-609.
English Site サイトマップ